A model-based standardization approach that separates true bias/DIF from group ability differences and detects test bias/DTF as well as item bias/DIF

Robin Shealy
William Stout

DOI

Abstract

item bias, test bias, DIF, differential test functioning, DTF, SIB, SIBTEST, standardization, simultaneous items bias, valid subtest, bias/DIF, Mantel-Haenszel,

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A model-based standardization approach that separates true bias/DIF from group ability differences and detects test bias/DTF as well as item bias/DIF

Abstract

Extracted data

A model-based standardization approach that separates true bias/DIF from group ability differences and detects test bias/DTF as well as item bias/DIF

Abstract

Extracted data

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