As single-wall carbon nanotube (SWCNT) has special electrical and physical property, it can be used as excellent material to construct various nano electronic device. However, in the fabrication process, the modification of size, shape and even the electronic property, especially to the metallic SWCNT, is a key problem to be overcome. Here a modified nanomanipulation technology based on atomic force microscope (AFM) is utilized to perform various kinds of SWCNT manipulation, such as SWCNT separation, catalyst remove, continual nano buckles fabrication and even stretch to break, thus to modify the size, shape and eventually the electrical property of the SWCNT. In addition, the manipulation results are analyzed based on the mechanical mechan...
Applications based on Single Walled Carbon Nanotube (SWNT) are good example of the great need to con...
Carbon nanotube (CNT) is an ideal candidate for future nanoelectronics because of its small diameter...
Multiwalled carbon nanotube (MWCNT) atomic force microscope (AFM) probes were fabricated with contro...
As single-wall carbon nanotube (SWCNT) has special electrical and physical property, it can be used ...
In the fabrication process of nanoelectronic device arrays based on single-wall carbon nanotube (SWC...
Nanomanipulation based on atomic force microscope is one of the key technologies for nanomanufacturi...
We have investigated the possibility of using carbon nanotubes as flexible, mobile electrical probes...
Due to the unique electrical properties of carbon nanotube (CNT), CNT is often chosen as a building ...
To real-timely feel and see the manipulation process of multi-wall carbon nanotube (MWCNT) is requir...
The cutting and splitting of carbon nanotube bundles were realized with an atomic force microscopy (...
To real-timely feel and see the manipulation process of multi-wall carbon nanotube (MWCNT) is requir...
* Abstract- Carbon nanotube (CNT) is an ideal candidate for future nanoelectronics because of its sm...
Carbon nanotubes are novel materials with unique electrical and mechanical properties. Here we prese...
In this study, atomic force microscope (AFM) tips are used as tools to cut and manipulate carbon nan...
Carbon nanotubes are considered to be an ideal imaging tip for atomic force microscopy (AFM) applica...
Applications based on Single Walled Carbon Nanotube (SWNT) are good example of the great need to con...
Carbon nanotube (CNT) is an ideal candidate for future nanoelectronics because of its small diameter...
Multiwalled carbon nanotube (MWCNT) atomic force microscope (AFM) probes were fabricated with contro...
As single-wall carbon nanotube (SWCNT) has special electrical and physical property, it can be used ...
In the fabrication process of nanoelectronic device arrays based on single-wall carbon nanotube (SWC...
Nanomanipulation based on atomic force microscope is one of the key technologies for nanomanufacturi...
We have investigated the possibility of using carbon nanotubes as flexible, mobile electrical probes...
Due to the unique electrical properties of carbon nanotube (CNT), CNT is often chosen as a building ...
To real-timely feel and see the manipulation process of multi-wall carbon nanotube (MWCNT) is requir...
The cutting and splitting of carbon nanotube bundles were realized with an atomic force microscopy (...
To real-timely feel and see the manipulation process of multi-wall carbon nanotube (MWCNT) is requir...
* Abstract- Carbon nanotube (CNT) is an ideal candidate for future nanoelectronics because of its sm...
Carbon nanotubes are novel materials with unique electrical and mechanical properties. Here we prese...
In this study, atomic force microscope (AFM) tips are used as tools to cut and manipulate carbon nan...
Carbon nanotubes are considered to be an ideal imaging tip for atomic force microscopy (AFM) applica...
Applications based on Single Walled Carbon Nanotube (SWNT) are good example of the great need to con...
Carbon nanotube (CNT) is an ideal candidate for future nanoelectronics because of its small diameter...
Multiwalled carbon nanotube (MWCNT) atomic force microscope (AFM) probes were fabricated with contro...