The importance of EBIT data for Z-pinch plasma diagnostics

The results from the last six years of x-ray spectroscopy and spectropolarimetry of high energy density Z-pinch plasmas complemented by experiments with the electron beam ion trap (EBIT) at the Lawrence Livermore National Laboratory (LLNL) are presented. The two topics discussed are the development of M-shell x-ray W spectroscopic diagnostics and K-shell Ti spectropolarimetry of Z-pinch plasmas. The main focus is on radiation from a specific load configuration called an 'X-pinch'. X-pinches are excellent sources for testing new spectral diagnostics and for atomic modelling because of the high density and temperature of the pinch plasmas, which scale from a few {micro}m to several mm in size. They offer a variety of load configurations, which differ in wire connections, number of wires, and wire materials. In this work the study of X-pinches with tungsten wires combined with wires from other, lower-Z materials is reported. Utilizing data produced with the LLNL EBIT at different energies of the electron beam the theoretical prediction of line positions and intensity of M-shell W spectra were tested and calibrated. Polarization-sensitive X-pinch experiments at the University of Nevada, Reno (UNR) provide experimental evidence for the existence of strong electron beams in Ti and Mo X-pinch plasmas and motivate the development of x-ray spectropolarimetry of Z-pinch plasmas. This diagnostic is based on the measurement of spectra recorded simultaneously by two spectrometers with different sensitivity to the linear polarization of the observed lines and compared with theoretical models of polarization-dependent spectra. Polarization-dependent K-shell spectra from Ti X-pinches are presented and compared with model calculations and with spectra generated by a quasi-Maxwellian electron beam at the LLNL EBIT-II electron beam ion trap