Add to ORKGLifetime spectroscopy is a valuable tool for the characterization of PV materials. This paper combines modeling and experimental results to illustrate the injection-level dependent response of three transient excess-carrier decay techniques
Carrier lifetimes and bulk diffusion length are qualitatively measured as a means for qualification ...
AbstractThe light-biased dynamic analysis of excess carrier decay has been known to yield differenti...
This paper discusses examining the status and question of long-term stability of copper indium disel...
When the diffusion length of minority carriers becomes comparable with or larger than the thickness ...
We report results of minority carrier lifetime measurements for double-sided p-type Si heterojunctio...
Device fabrication and photoconductive lifetime decay measurements were used to characterize single ...
A transient photovoltage decay (TPVD) measurement system is currently being developed at CREST and m...
Lifetime spectroscopy is a valuable tool for the characterization of photovoltaic materials. Measure...
Minority carrier lifetime was measured by time-resolved photoluminescence (TRPL) method in sets of p...
This work presents the use of a combined measurement system for spectrally-resolved photoluminescenc...
This thesis presents a novel method to quantify the localised carrier collection efficiency of thin ...
This paper describes reasons that lifetime measurments may be irreproducible using iodine-in-ethanol...
This paper asserts that materials used for PV encapsulation must be evaluated for their ability to t...
New measurement capability measures semiconductor minority-carrier lifetimes in conditions that simu...
Transient photovoltage (TPV) is a technique frequently used to determine charge carrier lifetimes in...
Carrier lifetimes and bulk diffusion length are qualitatively measured as a means for qualification ...
AbstractThe light-biased dynamic analysis of excess carrier decay has been known to yield differenti...
This paper discusses examining the status and question of long-term stability of copper indium disel...
When the diffusion length of minority carriers becomes comparable with or larger than the thickness ...
We report results of minority carrier lifetime measurements for double-sided p-type Si heterojunctio...
Device fabrication and photoconductive lifetime decay measurements were used to characterize single ...
A transient photovoltage decay (TPVD) measurement system is currently being developed at CREST and m...
Lifetime spectroscopy is a valuable tool for the characterization of photovoltaic materials. Measure...
Minority carrier lifetime was measured by time-resolved photoluminescence (TRPL) method in sets of p...
This work presents the use of a combined measurement system for spectrally-resolved photoluminescenc...
This thesis presents a novel method to quantify the localised carrier collection efficiency of thin ...
This paper describes reasons that lifetime measurments may be irreproducible using iodine-in-ethanol...
This paper asserts that materials used for PV encapsulation must be evaluated for their ability to t...
New measurement capability measures semiconductor minority-carrier lifetimes in conditions that simu...
Transient photovoltage (TPV) is a technique frequently used to determine charge carrier lifetimes in...
Carrier lifetimes and bulk diffusion length are qualitatively measured as a means for qualification ...
AbstractThe light-biased dynamic analysis of excess carrier decay has been known to yield differenti...
This paper discusses examining the status and question of long-term stability of copper indium disel...