The development of third generation light sources like theAdvanced Light Source (ALS) or BESSY II brought to a focus the need forhigh performance synchrotron optics with unprecedented tolerances forslope error and micro roughness. Proposed beam lines at Free ElectronLasers (FEL) require optical elements up to a length of one meter,characterized by a residual slope error in the range of 0.1murad (rms),and rms values of 0.1 nm for micro roughness. These optical elements mustbe inspected by highly accurate measuring instruments, providing ameasurement uncertainty lower than the specified accuracy of the surfaceunder test. It is essential that metrology devices in use at synchrotronlaboratories be precisely characterized and calibrated to achie...
The effective utilization of synchrotron radiation (SR) from high-brightness sources requires the us...
As requirements for surface slope error quality of grazing incidence optics approach the 100 nanorad...
To fully exploit the ultimate source properties of the next generation light sources, such as free ...
The development of third generation light sources like the Advanced Light Source (ALS) or BESSY II ...
The ultimate performance of surface slope metrology instrumentation, such as long trace profilers an...
The ultimate performance of surface slope metrology instrumentation, such as long trace profilers an...
X ray optics, desired for beamlines at free electron laser and diffraction limited storage ring x ra...
To preserve the brightness and coherence of x-rays produced by diffraction-limited-storage-ring (DLS...
The next generation of synchrotrons and free electron laser facilities requires x-ray optical system...
X-ray optics, desired for beamlines at free-electron-laser and diffraction-limited-storage-ring x-ra...
Ultra precise reflective and diffractive optical elements like blazed diffraction gratings or ultra ...
Slope measuring deflectometry allows the non-contact measuring of curves surfaces like ultra-precise...
To fully exploit the ultimate source properties of the next-generation lightsources, such as free-el...
Performance of state-of-the-art surface slope measuring profilers, such as the Advanced Light Source...
Development of X-ray optics for 3rd and 4th generation X-ray light sources with a level of surface s...
The effective utilization of synchrotron radiation (SR) from high-brightness sources requires the us...
As requirements for surface slope error quality of grazing incidence optics approach the 100 nanorad...
To fully exploit the ultimate source properties of the next generation light sources, such as free ...
The development of third generation light sources like the Advanced Light Source (ALS) or BESSY II ...
The ultimate performance of surface slope metrology instrumentation, such as long trace profilers an...
The ultimate performance of surface slope metrology instrumentation, such as long trace profilers an...
X ray optics, desired for beamlines at free electron laser and diffraction limited storage ring x ra...
To preserve the brightness and coherence of x-rays produced by diffraction-limited-storage-ring (DLS...
The next generation of synchrotrons and free electron laser facilities requires x-ray optical system...
X-ray optics, desired for beamlines at free-electron-laser and diffraction-limited-storage-ring x-ra...
Ultra precise reflective and diffractive optical elements like blazed diffraction gratings or ultra ...
Slope measuring deflectometry allows the non-contact measuring of curves surfaces like ultra-precise...
To fully exploit the ultimate source properties of the next-generation lightsources, such as free-el...
Performance of state-of-the-art surface slope measuring profilers, such as the Advanced Light Source...
Development of X-ray optics for 3rd and 4th generation X-ray light sources with a level of surface s...
The effective utilization of synchrotron radiation (SR) from high-brightness sources requires the us...
As requirements for surface slope error quality of grazing incidence optics approach the 100 nanorad...
To fully exploit the ultimate source properties of the next generation light sources, such as free ...