Add to ORKGThe LBNL 88-Inch Cyclotron offers broad-spectrum neutrons for single event effects testing. We discuss results from this beamline for neutron soft upsets in Xilinx Virtex-4 and -5 field-programmable-gate-array (FPGA) devices
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concer...
International audienceA sensitivity characterization of a Xilinx Artix-7 field programmable gate arr...
It is well known that alpha particles cause soft errors in LSI. Recently, it has been found that cos...
The LBNL 88-Inch Cyclotron offers broad-spectrum neutrons for single event effects testing. We discu...
As the dimensions and operating voltage of semiconductor devices are reduced, neutron-induced soft e...
This paper provides an experimental study of the single-event upset (SEU) susceptibility against the...
We introduce a new hardware/software platform for testing SRAM-based FPGAs under heavy-ion and neut...
In outer space down to the altitudes routinely flown by larger aircrafts, radiation can pose serious...
described real-time experiments that evaluated large Xilinx FPGAs fabricated in two CMOS technologie...
The VESUVIO beam line at the ISIS spallation neutron source was set up for neutron irradiation test...
This paper presents an experimental study of the sensitivity to 15-MeV neutrons at low bias voltage ...
We investigate atmospheric neutron effects on floating-gate cells in NAND Flash memory devices. Char...
High energy neutrons in terrestrial cosmic ray, with energies greater than several MeV, are the main...
Cette thèse s’intéresse aux effets des particules présentent naturellement dans l’atmosphère. L'étud...
Accelerator-based neutron sources offer many advantages, in particular tunability of the neutron bea...
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concer...
International audienceA sensitivity characterization of a Xilinx Artix-7 field programmable gate arr...
It is well known that alpha particles cause soft errors in LSI. Recently, it has been found that cos...
The LBNL 88-Inch Cyclotron offers broad-spectrum neutrons for single event effects testing. We discu...
As the dimensions and operating voltage of semiconductor devices are reduced, neutron-induced soft e...
This paper provides an experimental study of the single-event upset (SEU) susceptibility against the...
We introduce a new hardware/software platform for testing SRAM-based FPGAs under heavy-ion and neut...
In outer space down to the altitudes routinely flown by larger aircrafts, radiation can pose serious...
described real-time experiments that evaluated large Xilinx FPGAs fabricated in two CMOS technologie...
The VESUVIO beam line at the ISIS spallation neutron source was set up for neutron irradiation test...
This paper presents an experimental study of the sensitivity to 15-MeV neutrons at low bias voltage ...
We investigate atmospheric neutron effects on floating-gate cells in NAND Flash memory devices. Char...
High energy neutrons in terrestrial cosmic ray, with energies greater than several MeV, are the main...
Cette thèse s’intéresse aux effets des particules présentent naturellement dans l’atmosphère. L'étud...
Accelerator-based neutron sources offer many advantages, in particular tunability of the neutron bea...
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concer...
International audienceA sensitivity characterization of a Xilinx Artix-7 field programmable gate arr...
It is well known that alpha particles cause soft errors in LSI. Recently, it has been found that cos...