In the Electro-Optical Characterization group, within the National Center for Photovoltaic's Measurements and Characterization Division, we use various electrical and optical experimental techniques to relate photovoltaic device performance to the methods and materials used to produce them. The types of information obtained by these techniques range from small-scale atomic-bonding information to large-scale macroscopic quantities such as optical constants and electron-transport properties. Accurate and timely measurement of the electro-optical properties as a function of device processing provides researchers and manufacturers with the knowledge needed to troubleshoot problems and develop the knowledge base necessary for reducing cost, maxi...
The structural, electrical and optical characterization of silicon and silicon devices can be presen...
Solar energy conversion, miniaturization of semiconductor devices and associated lifetime, reliabili...
none3noThe structural, electrical and optical characterization of silicon and silicon devices can be...
One of the core issues in all of the photovoltaics technologies is relating PV device performance to...
This brochure presents the capabilities that the Measurements and Characterization Division has in E...
Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizatio...
This brochure presents the capabilities that the Measurements and Characterization Division has in d...
Abstract — This study shows the results obtained with an integrated system capable of performing the...
In this chapter we present basic concepts which are relevant to link the results obtained from ellip...
In the various chapters of this book, numerous characterization techniques are presented that can be...
This paper will describe the resources at the National Renewable Energy Laboratory (NREL) for perfor...
The accurate measure of semiconductor electrical properties is a fundamental step for the design and...
The structural, electrical and optical characterization of silicon and silicon devices can be presen...
The accurate measure of semiconductor electrical properties is a fundamental step for the design and...
The accurate measure of semiconductor electrical properties is a fundamental step for the design and...
The structural, electrical and optical characterization of silicon and silicon devices can be presen...
Solar energy conversion, miniaturization of semiconductor devices and associated lifetime, reliabili...
none3noThe structural, electrical and optical characterization of silicon and silicon devices can be...
One of the core issues in all of the photovoltaics technologies is relating PV device performance to...
This brochure presents the capabilities that the Measurements and Characterization Division has in E...
Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizatio...
This brochure presents the capabilities that the Measurements and Characterization Division has in d...
Abstract — This study shows the results obtained with an integrated system capable of performing the...
In this chapter we present basic concepts which are relevant to link the results obtained from ellip...
In the various chapters of this book, numerous characterization techniques are presented that can be...
This paper will describe the resources at the National Renewable Energy Laboratory (NREL) for perfor...
The accurate measure of semiconductor electrical properties is a fundamental step for the design and...
The structural, electrical and optical characterization of silicon and silicon devices can be presen...
The accurate measure of semiconductor electrical properties is a fundamental step for the design and...
The accurate measure of semiconductor electrical properties is a fundamental step for the design and...
The structural, electrical and optical characterization of silicon and silicon devices can be presen...
Solar energy conversion, miniaturization of semiconductor devices and associated lifetime, reliabili...
none3noThe structural, electrical and optical characterization of silicon and silicon devices can be...