A major challenge to understanding the fate of contaminants in environment is the direct identification of trace concentrations (ppm to ppb) at the sub-micron scale. In order to efficiently characterize the trace metals in various environmental and geological samples, we have utilized high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) combined with conventional TEM techniques. In general, the image contrast observed in the HAADF-STEM is correlated to the atomic mass: heavier elements contribute to a brighter contrast. Additionally, the contrast in HAADF-STEM is characteristically independent of focus, because the image is formed by incoherent scattering. Remarkable results obtained using the advanced TEM te...