Analysis of grain boundaries, twin boundaries, and Te precipitates in CdZnTe grown by high-pressure Bridgeman method

Grain boundaries and twin boundaries in commercial Cd{sub 1{minus}x}Zn{sub x}Te, which is prepared by a high pressure Bridgeman technique, have been investigated with transmission electron microscopy, scanning electron microscopy, infrared light microscopy and visible light microscopy. Boundaries inside these materials were found to be decorated with Te precipitates. The shape and local density of the precipitates were found to depend on the particular boundary. For precipitates that decorate grain boundaries, their microstructure was found to consist of a single, saucer shaped grain of hexagonal Te (space group P3{sub 1}21). Analysis of a Te precipitate precipitates by selected area diffraction revealed the Te to be aligned with the surrounding Cd{sub 1{minus}x}Zn{sub x}Te grains. This alignment was found to match the (111) Cd{sub 1{minus}x}Z{sub x}Te planes with the (1{bar 1}01) planes of hexagonal Te. Crystallographic alignments between the Cd{sub 1{minus}x}Zn{sub x}Te grains were also observed for a high angle grain boundary. The structure of the grain boundaries and the Te/Cd{sub 1{minus}x}Zn{sub x}Te interface are discussed