The Long Trace Profiler (LTP), an instrument for measuring the slope profile of long X-ray mirrors, has been used for adjusting bendable mirrors. Often an elliptical profile is desired for the mirror surface, since many synchrotron applications involve imaging a point source to a point image. Several techniques have been used in the past for adjusting the profile measured in height or slope of a bendable mirror. Underwood et al. have used collimated X-rays for achieving desired surface shape for bent glass optics. Non linear curve fitting using the simplex algorithm was later used to determine the best fit ellipse to the surface under test. A more recent method uses a combination of least squares polynomial fitting to the measured slope fun...
Of the many methods used to focus x-rays, the use of mirrors with an elliptical curvature shows the ...
We review the development at the Advanced Light Source (ALS) of bendable x-ray optics widely used fo...
The effective utilization of synchrotron radiation (SR) from high-brightness sources requires the us...
We report on a new fast and effective method for the precise adjustments of bendable mirrors to achi...
We describe a technique to optimally tune and calibrate bendable x-ray optics for sub-micron focusin...
Performance of state-of-the-art surface slope measuring profilers, such as the Advanced Light Source...
We discuss experimental, analytical, and numerical methods recently developed at the Advanced Light ...
The Long Trace Profiler (LTP) is in use at several synchrotron radiation (SR) laboratories throughou...
As requirements for measuring mirrors with more accuracy become more demanding, knowledge of the Lon...
A simple device composed of a modular double-pentaprism system that enables the long trace profiler ...
The Long Trace Profiler (LTP) is in use at a number of locations throughout the world for the measur...
An elliptically bent mirror of total length 1.25 m has been developed at the Advanced Light Source (...
The Long Trace Profiler (LTP) is in use at many synchrotron radiation (SR) laboratories throughout t...
A low-budget surface slope measuring instrument, the Developmental Long Trace Profiler (DLTP), was r...
Many instruments and techniques are used for measuring long mirror surfaces. A Fizeau interferometer...
Of the many methods used to focus x-rays, the use of mirrors with an elliptical curvature shows the ...
We review the development at the Advanced Light Source (ALS) of bendable x-ray optics widely used fo...
The effective utilization of synchrotron radiation (SR) from high-brightness sources requires the us...
We report on a new fast and effective method for the precise adjustments of bendable mirrors to achi...
We describe a technique to optimally tune and calibrate bendable x-ray optics for sub-micron focusin...
Performance of state-of-the-art surface slope measuring profilers, such as the Advanced Light Source...
We discuss experimental, analytical, and numerical methods recently developed at the Advanced Light ...
The Long Trace Profiler (LTP) is in use at several synchrotron radiation (SR) laboratories throughou...
As requirements for measuring mirrors with more accuracy become more demanding, knowledge of the Lon...
A simple device composed of a modular double-pentaprism system that enables the long trace profiler ...
The Long Trace Profiler (LTP) is in use at a number of locations throughout the world for the measur...
An elliptically bent mirror of total length 1.25 m has been developed at the Advanced Light Source (...
The Long Trace Profiler (LTP) is in use at many synchrotron radiation (SR) laboratories throughout t...
A low-budget surface slope measuring instrument, the Developmental Long Trace Profiler (DLTP), was r...
Many instruments and techniques are used for measuring long mirror surfaces. A Fizeau interferometer...
Of the many methods used to focus x-rays, the use of mirrors with an elliptical curvature shows the ...
We review the development at the Advanced Light Source (ALS) of bendable x-ray optics widely used fo...
The effective utilization of synchrotron radiation (SR) from high-brightness sources requires the us...