We have developed a positron lifetime defect analysis capability based on a 3 MeV electrostatic accelerator. The high energy beam lifetime spectrometer is operational with a 60 mCi {sup 22}Na source providing a current of 7 10{sup 5} positrons per second. Lifetime data are derived from a thin plastic transmission detector providing an implantation time and a BaF{sub 2} detector to determine the annihilation time. Positron lifetime analysis is performed with a 3 MeV positron beam on thick sample specimens at counting rates in excess of 2000 per second. The instrument is being used for bulk sample analysis and analysis of samples encapsulated in controlled environments for in situ measurements
Positron lifetime measurements are used as a tool for obtaining a deeper understanding of positron b...
Positron Annihilation Lifetime Spectroscopy can be used to characterize radia- tion-induced material...
The central task of positron lifetime spectroscopy is that of determining defect types and concentra...
We are using a defect analysis capabilities based on two positron beam lifetime spectrometers: the f...
Defect analysis is needed for samples ranging in thickness from thin films to large engineering part...
We are developing a defect analysis capability based on two positron beam lifetime spectrometers: th...
A new intense positron beam lifetime spectrometer is being developed at the Reactor Institute Delft ...
AbstractA slow-positron beam system for in-situ positron lifetime measurements during ion beam irrad...
Positron lifetime spectroscopy is a powerful tool to identify vacancy type defects in semiconductor ...
Positron lifetime spectroscopy is a powerful tool to identify vacancy type defects in semiconductor ...
04Positron Annihilation Lifetime Spectroscopy (PALS)is an increasingly important analysis technique ...
The major aspect of this research is the development of a variable-energy PALS beamline based on a S...
Lawrence Livermore National Laboratory (LLNL) is the home of the world's highest current beam of keV...
Positron lifetime measurements are used as a tool for obtaining a deeper understanding of positron b...
Positron annihilation lifetime spectroscopy (PALS) is a notoriously difficult technique to apply on ...
Positron lifetime measurements are used as a tool for obtaining a deeper understanding of positron b...
Positron Annihilation Lifetime Spectroscopy can be used to characterize radia- tion-induced material...
The central task of positron lifetime spectroscopy is that of determining defect types and concentra...
We are using a defect analysis capabilities based on two positron beam lifetime spectrometers: the f...
Defect analysis is needed for samples ranging in thickness from thin films to large engineering part...
We are developing a defect analysis capability based on two positron beam lifetime spectrometers: th...
A new intense positron beam lifetime spectrometer is being developed at the Reactor Institute Delft ...
AbstractA slow-positron beam system for in-situ positron lifetime measurements during ion beam irrad...
Positron lifetime spectroscopy is a powerful tool to identify vacancy type defects in semiconductor ...
Positron lifetime spectroscopy is a powerful tool to identify vacancy type defects in semiconductor ...
04Positron Annihilation Lifetime Spectroscopy (PALS)is an increasingly important analysis technique ...
The major aspect of this research is the development of a variable-energy PALS beamline based on a S...
Lawrence Livermore National Laboratory (LLNL) is the home of the world's highest current beam of keV...
Positron lifetime measurements are used as a tool for obtaining a deeper understanding of positron b...
Positron annihilation lifetime spectroscopy (PALS) is a notoriously difficult technique to apply on ...
Positron lifetime measurements are used as a tool for obtaining a deeper understanding of positron b...
Positron Annihilation Lifetime Spectroscopy can be used to characterize radia- tion-induced material...
The central task of positron lifetime spectroscopy is that of determining defect types and concentra...