Secondary ion mass spectrometry (SIMS) was evaluated for applicability to the characterization of salt cake and environmental samples. Salt cake is representative of waste found in radioactive waste storage tanks located at Hanford and at other DOE sites; it consists of nitrate, nitrite, hydroxide, and ferrocyanide salts, and the samples form the tanks are extremely radioactive. SIMS is an attractive technology for characterizing these samples because it has the capability for producing speciation information with little or no sample preparation, and it generates no additional waste. Experiments demonstrated that substantial speciation information could be readily generated using SIMS: metal clusters which include nitrate, nitrite, hydroxid...
Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a...
Secondary ion mass spectrometry (SIMS, or ion microprobe) represents an extremely sensitive techniqu...
In Secondary Ion Mass Spectrometry (SIMS) a focused beam of energetic ions (so-called primary ions) ...
This report provides an overview of the ``SIMS Analysis: Development and Evaluation Program``, which...
Secondary ion mass spectrometry (SIMS) was evaluated for characterizing Hg salts. It was found that ...
The principles and operating modes of secondary ion mass spectrometry (SIMS) are first described aft...
Secondary Ion Mass Spectrometry (SIMS) is used for elemental and isotopic analysis of solid samples....
The influence of sample preparation on the ion yield in s-SIMS for alkaline salts was investigated. ...
Secondary ion mass spectrometry (SIMS) is a highly sensitive chemical analysis technique available i...
Due to the character of the original source materials and the nature of batch digitization, quality ...
This paper reviews the current state of Secondary Ion Mass Spectrometry (SIMS) applied to the invest...
New applications of ion bombardment in secondary ion mass spectrometry (SIMS) are reviewed. Recent d...
Mining companies are continuously searching for new technologies that can improve plant efficiency, ...
Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a...
Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166This article outlines the basis...
Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a...
Secondary ion mass spectrometry (SIMS, or ion microprobe) represents an extremely sensitive techniqu...
In Secondary Ion Mass Spectrometry (SIMS) a focused beam of energetic ions (so-called primary ions) ...
This report provides an overview of the ``SIMS Analysis: Development and Evaluation Program``, which...
Secondary ion mass spectrometry (SIMS) was evaluated for characterizing Hg salts. It was found that ...
The principles and operating modes of secondary ion mass spectrometry (SIMS) are first described aft...
Secondary Ion Mass Spectrometry (SIMS) is used for elemental and isotopic analysis of solid samples....
The influence of sample preparation on the ion yield in s-SIMS for alkaline salts was investigated. ...
Secondary ion mass spectrometry (SIMS) is a highly sensitive chemical analysis technique available i...
Due to the character of the original source materials and the nature of batch digitization, quality ...
This paper reviews the current state of Secondary Ion Mass Spectrometry (SIMS) applied to the invest...
New applications of ion bombardment in secondary ion mass spectrometry (SIMS) are reviewed. Recent d...
Mining companies are continuously searching for new technologies that can improve plant efficiency, ...
Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a...
Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166This article outlines the basis...
Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a...
Secondary ion mass spectrometry (SIMS, or ion microprobe) represents an extremely sensitive techniqu...
In Secondary Ion Mass Spectrometry (SIMS) a focused beam of energetic ions (so-called primary ions) ...