Measurement of sub-picosecond bunch profiles using coherent transition radiation

A technique for measuring the longitudinal profile of sub-picosecond electron bunches based on autocorrelation of coherent transition radiation is reviewed. The technique uses sub-millimeter/far-infrared Michelson interferometry to obtain the autocorrelation of transition radiation emitted from a thin conducting foil placed in the beam path. The theory of coherent radiation from a charged particle beam passing through a thin conducting foil is presented for normal and oblique incidence. Michelson interferometric analysis of this radiation is shown to provide the autocorrelation of longitudinal bunch profile. The details of a noninvasive technique for measuring longitudinal bunch profile using coherent diffraction radiation are discussed