Waveguide Zeeman interferometry for thin-film chemical sensors
- Grace, K. M.
- Shrouf, K.
- Johnston, R. G.
- Yang, X.
- Swanson, B.
- Honkanen, S.
- Ayras, P.
- Peyghambarian, N.
- Katila, P.
- Leppihalme, M.
Publication date
October 1997
DOI Publisher
Los Alamos National Laboratory ISSN
0013-5194 Citation count (estimate)
10Abstract
A chemical sensor is demonstrated which is based on Si{sub 3}N{sub 4} optical waveguides coated with species-selective thin films and using Zeeman interferometry as the detection technique. Relative phase change between TE and TM modes is measured. Real time and reversible response to toluene is shown with ppm level sensitivity
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