Radiation effects on front-end electronics for noble liquid calorimetry

Front-end electronics for liquid ionization chamber calorimetry at hadron collider experiments may be exposed to substantial levels of ionizing radiation and neutron fluences in a cryogenic environment. Measurements of devices built with rad-hard technologies have shown that devices able to operate in these conditions exist. Si-JFETs and GaAs MESFET devices have been irradiated and tested at a stable cryogenic temperature up to doses of 55 Mrad of ionizing radiation and up to neutron fluences of 4 {times} 10{sup 14} n/cm{sup 2}. Radiation effects on DC characteristics and on noise will be presented