Studies of double-sided silicon microstrip detectors
- Seidel, S.C.
- Bruner, N.L.
- Frautsch, M.A.
- Hoeferkamp, M.R.
- Patton, A.
Publication date
March 1996
DOI Publisher
Fermi National Accelerator Laboratory ISSN
0168-9002Abstract
The electrical characteristics of detectors manufactured by SINTEF/SI with a variety of geometrical and processing options have been investigated. The detectors` leakage current, depletion voltage, bias resistance, interstrip resistance, coupling capacitance, and coupling capacitor breakdown voltage were studied
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