Measurements of laser imprint by XUV radiography using an x-ray laser

We have developed a technique for studying the imprint of a laser beam on a thin foil using an x-ray laser as an XUV backlighter and XUV multilayer optics. This technique allows us to measure small fractional variations in the foil thickness due to hydrodynamics imprinted by direct laser irradiation. We present results of imprinted modulation and growth due to a low intensity 0.53 {mu}m drive beam incident on a 2 {mu}m Al foil using a germanium x-ray laser at the Vulcan facility. We present measurements of the modulation due to static RPP, SSD smoothed, and ISI smoothed speckle patterns at 0.53 {mu}m irradiation