Research of Fabrication and Characterizations of ZnO Nanorods Grown on Metal Substrates and Metal Wires

[[abstract]]本研究係以電化學沉積法製作氧化鋅奈米柱的晶種層，成長於各種導電性的基板上；再以水熱法成長氧化鋅奈米柱，主要是於常溫和常壓環境下生長。 本實驗以硝酸鋅與硝酸鉀，濃度1:1的比例，配上100ml DI水之混合溶液，固定其反應時間與溫度分別6秒及70ºC，作為電鍍晶種層之條件；再以醋酸鋅與六甲烯四胺，配上100 ml之DI水，置備氧化鋅奈米柱之成長液於100ml之血清瓶中，固定其反應時間與溫度分別1小時及80ºC。 並且以不同之基材、有無研磨基版、電流密度、參雜graphene等為反應參數，合成出一維氧化鋅奈米柱，用以探討氧化鋅奈米柱之表面形態與特性。 以X光繞射儀(XRD)、能量分佈質譜儀（EDX）、接觸角量測儀與場發射掃描式電子顯微鏡(FE-SEM)分別鑑定氧化鋅晶體結構與表面形態；於不同電流密度下所製備出之氧化鋅奈米柱具有不同之堆積密度，且在電流密度較小的情況下，有較佳的疏水性質與結晶結構，而經研磨後之基材，則具有較佳的沈積環境供氧化鋅奈米柱之生長；亦發現以不鏽鋼、紅銅、黃銅、鉛等金屬基材，皆有成長出六方晶體結構，錫雖無六方晶體結構，亦有其特殊的表面結晶型態。 至於電性量測方面，利用半導體參數分析儀做為電性量測之工具，將正負極接於線材兩端，並通與穩定之直流電，借此量測線材之電阻值。可發現參雜graphene或生長奈米柱之線材，導電性有減弱之現象。[[abstract]]In this thesis, we used electrochemical deposition methods to deposit a seed layer on various metal substrates, followed by hydrothermal methods to grow ZnO nanorods under a room-temperature environment. In this experiment, we mixed zinc nitrate hexahydrate, potassium nitrate (zinc nitrate hexahydrate: potassium nitrate = 1:1) and DI water 100 ml as plating solution with the deposition time of 6 seconds and the deposition temperature of 70 ºC for the seed-layer electroplating solution. Then, an appropriate amount of zinc acetate and hexamethylenetetramine added in DI water 100ml was used as the solution for the hydrothermal growth of the ZnO nanorods with the reaction time of 1 hour and the reaction temperature of 80 ºC. We investigated the nanorods’surface characteristics and morphologies with various growth parameters such as different substrates, current density, substrate roughness with polishing,and graphene addition. In order to observe the material properties of the nanorods under different experimental conditions, a cold field-emission scanning electron microscope (FE-SEM) was utilized to observe the surface morphologies. Moreover, we applied X-ray diffraction analyzer (XRD) and energy dispersive X-ray spectrometer (EDX) to observe the crystalline structures and the element compositions of the zinc oxide nanorods on various metal substrates. Finally, we used Semiconductor Device Analyzer Mainframe (Agilent HP 4155C) to measure the resistive change of the wire incorporating nanorods. Results indicate that metal wires incorporating nanorods or graphene have a higher resistance.[[note]]碩