This paper explores the possibilities for imaging and chemical analysis of thin foil specimens in the SEM. Bright field and dark field imaging provide high resolution imaging with crystallographic information within the grains. In multiphase materials with varying electron transmission the dark field images generally provide a more even contrast in all phases. It is possible to obtain high-quality quantitative EDX data with high spatial resolution
Abstract: High Resolution Transmission Electron Microscopy (HR-TEM) has been used as the ultimate me...
SIGLEAvailable from British Library Document Supply Centre- DSC:D43600/82 / BLDSC - British Library ...
Recent developments in applications of the scanning very low energy electron microscopy in selected ...
This paper explores the possibilities for imaging and chemical analysis of thin foil specimens in th...
The use of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into t...
Abstract In this paper, we used back-foil scanning X-ray microfluorescence (SXRF) and we examined th...
Providing a comprehensive introduction to the capabilities and use of scanning electron microscopes ...
In this paper, we describe hollow-cone dark field (HCDF) transmission electron microscopy (TEM) imag...
In this paper, we describe hollow-cone dark field (HCDF) transmission electron microscopy (TEM) imag...
Electron backscatter diffraction (EBSD) is a micro-analytical technique typically attached to a scan...
Thin-film technology is used in many applications and often requires structural and chemical analyse...
When a focused electron beam impinges on a cathodoluminescent (CL) material in a scanning electron m...
The development of advanced materials is inseparably connected with detailed knowledge of the relati...
Examination of thin samples in TEM or STEM has been performed at hundreds of keV. This energy range ...
Scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS), wavelength dispersive spec...
Abstract: High Resolution Transmission Electron Microscopy (HR-TEM) has been used as the ultimate me...
SIGLEAvailable from British Library Document Supply Centre- DSC:D43600/82 / BLDSC - British Library ...
Recent developments in applications of the scanning very low energy electron microscopy in selected ...
This paper explores the possibilities for imaging and chemical analysis of thin foil specimens in th...
The use of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into t...
Abstract In this paper, we used back-foil scanning X-ray microfluorescence (SXRF) and we examined th...
Providing a comprehensive introduction to the capabilities and use of scanning electron microscopes ...
In this paper, we describe hollow-cone dark field (HCDF) transmission electron microscopy (TEM) imag...
In this paper, we describe hollow-cone dark field (HCDF) transmission electron microscopy (TEM) imag...
Electron backscatter diffraction (EBSD) is a micro-analytical technique typically attached to a scan...
Thin-film technology is used in many applications and often requires structural and chemical analyse...
When a focused electron beam impinges on a cathodoluminescent (CL) material in a scanning electron m...
The development of advanced materials is inseparably connected with detailed knowledge of the relati...
Examination of thin samples in TEM or STEM has been performed at hundreds of keV. This energy range ...
Scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS), wavelength dispersive spec...
Abstract: High Resolution Transmission Electron Microscopy (HR-TEM) has been used as the ultimate me...
SIGLEAvailable from British Library Document Supply Centre- DSC:D43600/82 / BLDSC - British Library ...
Recent developments in applications of the scanning very low energy electron microscopy in selected ...