Skewed zero-bound distributions and process capability indices for upper specifications

A common practical situation in process capability analysis, which is not well developed theoretically, is when the quality characteristic of interest has a skewed distribution with a long tail towards relatively large values and an upper specification limit only exists. In such situations, it is not uncommon that the smallest possible value of the characteristic is 0 and this is also the best value to obtain. Hence a target value 0 is assumed to exist. We investigate a new class of process capability indices for this situation. Two estimators of the proposed index are studied and the asymptotic distributions of these estimators are derived. Furthermore, we suggest a decision procedure useful when drawing conclusions about the capability at a given significance level, based on the estimated indices and their asymptotic distributions. A simulation study is also performed, assuming that the quality characteristic is Weibull-distributed, to investigate the true significance level when the sample size is finite.capability index, skewed distributions, one-sided specification interval, upper specification limit, zero-bound process data, target value 0, hypothesis testing, Weibull distribution,