This paper discusses a reliability based optimisation modelling approach demonstrated for the design of a SiP structure integrated by stacking dies one upon the other. In this investigation the focus is on the strategy for handling the uncertainties in the package design inputs and their implementation into the design optimisation modelling framework. The analysis of fhermo-mechanical behaviour of the package is utilised to predict the fatigue life-time of the lead-free board level solder interconnects and warpage of the package under thermal cycling. The SiP characterisation is obtained through the exploitation of Reduced Order Models (ROM) constructed using high fidelity analysis and Design of Experiments (DoE) methods. The design task is...
This contribution presents a novel and comprehensive design approach - the M3-approach (methodologie...
In this paper the reliability of the isolation substrate and chip mountdown solder interconnect of p...
This thesis project is a study of the predictive reliability of new microelectronic package concepts...
A computational modelling approach integrated with optimisation and statistical methods that can aid...
This presentation discusses latest developments in SiP technology and the challenges for design in t...
This paper discusses the Design for Reliability modelling of several System-in-Package (SiP) structu...
Design for manufacture of system-in-package (SiP) structures is dependent on a number of physical pr...
Purpose – To present key challenges associated with the evolution of system-in-package technologies ...
Purpose – To present key challenges associated with the evolution of system-in-package technologies ...
Purpose – This paper aims to present an integrated optimisation-modelling computational approach for...
Ce projet de thèse se situe dans le cadre de l'étude de la fiabilité prédictive de nouveaux concepts...
Ce projet de thèse se situe dans le cadre de l'étude de la fiabilité prédictive de nouveaux concepts...
System-in-Package (SiP) design methodology integrates multiple dies which come from different vendor...
In order to reduce possible reliability risks in the early stage of package design, the development ...
[[abstract]]©2009 IEEE-System-in-package (SiP) design methodology integrates multiple dies which com...
This contribution presents a novel and comprehensive design approach - the M3-approach (methodologie...
In this paper the reliability of the isolation substrate and chip mountdown solder interconnect of p...
This thesis project is a study of the predictive reliability of new microelectronic package concepts...
A computational modelling approach integrated with optimisation and statistical methods that can aid...
This presentation discusses latest developments in SiP technology and the challenges for design in t...
This paper discusses the Design for Reliability modelling of several System-in-Package (SiP) structu...
Design for manufacture of system-in-package (SiP) structures is dependent on a number of physical pr...
Purpose – To present key challenges associated with the evolution of system-in-package technologies ...
Purpose – To present key challenges associated with the evolution of system-in-package technologies ...
Purpose – This paper aims to present an integrated optimisation-modelling computational approach for...
Ce projet de thèse se situe dans le cadre de l'étude de la fiabilité prédictive de nouveaux concepts...
Ce projet de thèse se situe dans le cadre de l'étude de la fiabilité prédictive de nouveaux concepts...
System-in-Package (SiP) design methodology integrates multiple dies which come from different vendor...
In order to reduce possible reliability risks in the early stage of package design, the development ...
[[abstract]]©2009 IEEE-System-in-package (SiP) design methodology integrates multiple dies which com...
This contribution presents a novel and comprehensive design approach - the M3-approach (methodologie...
In this paper the reliability of the isolation substrate and chip mountdown solder interconnect of p...
This thesis project is a study of the predictive reliability of new microelectronic package concepts...