Characterization of Indentation-Induced Pattern Using Full-Field Strain Measurement

[[abstract]]In this study DIC-based strain analysis software was successfully developed and its strain resolution lies on the order of 2.3×10-4-3.1×10-4. Full strain field measurement was used to study indentation-induced plastic patterns around a spherical indenter for a polycrystals and a single crystal of pure aluminum. During indentation, a pure aluminum specimen of a single crystal revealed a symmetric indentation pattern of von Mises strain. The piling-up around the residual impression was successfully and directly characterized by examining the sign of strain and in the X and Y direction. However, the inward, out-of-plane movement resulted in an error in calculating in-plane strain referred as a “distortion strain” using two-dimensional DIC