Nuclear-fragmentation studies for microelectronic applications /

Duc, M. Ngo.
Langley Research Center.

Publication date

January 1989

Publisher

Washington, D.C. : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division ; Springfield, Va. : For sale by the National Technical Information Service,

Abstract

Research done at Langley Research Center.Bibliography: p. 7-8.Mode of access: Internet

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Nuclear-fragmentation studies for microelectronic applications /

Abstract

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Nuclear-fragmentation studies for microelectronic applications /

Abstract

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