Guideline for quality control of image scanners.

Evaluation of nondestructive inspection techniques for quality control of alumina-ceramic housing components /

Kurkchubasche, R. R.
Stachiw, Jerry D., 1931-
Johnson, R. P. (Richard P.)
Naval Command, Control, and Ocean Surveillance Center (U.S.). Research, Development, Test, and Evaluation Division.

"September 1993."Includes bibliographical references (p. 16).Mode of access: Internet

National Semiconductor Metrology Program : [catalog] /

National Institute of Standards and Technology (U.S.)
National Semiconductor Metrology Program (U.S.)
Electronics and Electrical Engineering Laboratory (National Institute of Standards and Technology)
National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs.

January 1995

Title from cover.Each issue cumulates from 1990 (i.e., v. for Mar. 1995 covers period 1990-1994).Mod...

Optical character recognition (OCR)--Dot matrix character sets for OCR-MA.

United States. National Bureau of Standards.

Cover title.Shipping list no.: 87-559-P."1987 May 6.""Category: Hardware standard, subcategory: char...

Guideline for lifecycle validation, verification, and testing of computer software.

United States. National Bureau of Standards.

January 1984

Cover title."1983 June 6.""Category: software, subcategory: validation, verification, and testing."B...

Guideline for computer security certification and accreditation : category, ADP operations, subcategory, computer security.

United States. National Bureau of Standards.

January 1984

Cover title."1983 September 27."Includes bibliographical references.Mode of access: Internet

Guidelines for formal verification systems.

National Computer Security Center (U.S.)

Cover title."1 April 1989."Includes bibliographical references.Final.Mode of access: Internet

Quality control in microbiology /

Miller, J. Michael (Jon Michael), 1945-
Centers for Disease Control (U.S.)

1983 ed. has title: Quality control in the microbiology laboratory."March 1983."Includes bibliograph...

Channel level power control interface : category, hardware standard : subcategory, interface.

United States. National Bureau of Standards.

January 1982

Cover title."1982 July 13.""Supersedes FIPS PUB 61, 1979 February 16."Mode of access: Internet

Computer graphics metafile (CGM).

United States. National Bureau of Standards.

January 1987

Shipping list no.: 87-330-P.Cover title."Category: Software standard, subcategory: graphics."1987 Ma...

Guideline for optical character recognition forms /

United States. National Bureau of Standards.

January 1976

May 1, 1976.Subcategory: Character recognition.No longer available for sale by the Supt. of Docs.Cat...

Guideline for selection of data entry equipment.

United States. National Bureau of Standards.

CODEN: FIPPAT.Sept. 30, 1979.Subcategory: Data entry equipment.Category: Hardware.Includes bibliogra...

Nondestructive testing /

Berger, Harold.
U.S. Atomic Energy Commission. Division of Technical Information.

Cover title."February 1969"--P.[3] of cover.Bibliography: p. 36-38.Mode of access: Internet

Single- and multi-level continuous sampling procedures and table for inspection by attributes.

United States. Dept. of Defense.

January 1981

Chiefly tables.Cover title."10 December 1981.""Superseding MIL-STD-1235A(MU), 28 June 1974."Mode of ...

Optical character recognition (OCR) inks : category, hardware standard; subcategory, character recognition.

United States. National Bureau of Standards.

January 1980

"1980 November 7.""Federal information processing standards publication."Mode of access: Internet

Calibration and related measurement services of the National Bureau of Standards.

United States. National Bureau of Standards. Office of Measurement Services.

Mode of access: Internet.Latest issue consulted: Apr. 1983.Description based on: June 1979; title fr...

Evaluation of nondestructive inspection techniques for quality control of alumina-ceramic housing components /

Kurkchubasche, R. R.
Stachiw, Jerry D., 1931-
Johnson, R. P. (Richard P.)
Naval Command, Control, and Ocean Surveillance Center (U.S.). Research, Development, Test, and Evaluation Division.

"September 1993."Includes bibliographical references (p. 16).Mode of access: Internet

National Semiconductor Metrology Program : [catalog] /

National Institute of Standards and Technology (U.S.)
National Semiconductor Metrology Program (U.S.)
Electronics and Electrical Engineering Laboratory (National Institute of Standards and Technology)
National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs.

January 1995

Title from cover.Each issue cumulates from 1990 (i.e., v. for Mar. 1995 covers period 1990-1994).Mod...

Optical character recognition (OCR)--Dot matrix character sets for OCR-MA.

United States. National Bureau of Standards.

Cover title.Shipping list no.: 87-559-P."1987 May 6.""Category: Hardware standard, subcategory: char...

Guideline for lifecycle validation, verification, and testing of computer software.

United States. National Bureau of Standards.

January 1984

Cover title."1983 June 6.""Category: software, subcategory: validation, verification, and testing."B...

Guideline for computer security certification and accreditation : category, ADP operations, subcategory, computer security.

United States. National Bureau of Standards.

January 1984

Cover title."1983 September 27."Includes bibliographical references.Mode of access: Internet

Guidelines for formal verification systems.

National Computer Security Center (U.S.)

Cover title."1 April 1989."Includes bibliographical references.Final.Mode of access: Internet

Quality control in microbiology /

Miller, J. Michael (Jon Michael), 1945-
Centers for Disease Control (U.S.)

1983 ed. has title: Quality control in the microbiology laboratory."March 1983."Includes bibliograph...

Channel level power control interface : category, hardware standard : subcategory, interface.

United States. National Bureau of Standards.

January 1982

Cover title."1982 July 13.""Supersedes FIPS PUB 61, 1979 February 16."Mode of access: Internet

Computer graphics metafile (CGM).

United States. National Bureau of Standards.

January 1987

Shipping list no.: 87-330-P.Cover title."Category: Software standard, subcategory: graphics."1987 Ma...

Guideline for optical character recognition forms /

United States. National Bureau of Standards.

January 1976

May 1, 1976.Subcategory: Character recognition.No longer available for sale by the Supt. of Docs.Cat...

Guideline for selection of data entry equipment.

United States. National Bureau of Standards.

CODEN: FIPPAT.Sept. 30, 1979.Subcategory: Data entry equipment.Category: Hardware.Includes bibliogra...

Nondestructive testing /

Berger, Harold.
U.S. Atomic Energy Commission. Division of Technical Information.

Cover title."February 1969"--P.[3] of cover.Bibliography: p. 36-38.Mode of access: Internet

Single- and multi-level continuous sampling procedures and table for inspection by attributes.

United States. Dept. of Defense.

January 1981

Chiefly tables.Cover title."10 December 1981.""Superseding MIL-STD-1235A(MU), 28 June 1974."Mode of ...

Optical character recognition (OCR) inks : category, hardware standard; subcategory, character recognition.

United States. National Bureau of Standards.

January 1980

"1980 November 7.""Federal information processing standards publication."Mode of access: Internet

Calibration and related measurement services of the National Bureau of Standards.

United States. National Bureau of Standards. Office of Measurement Services.

Mode of access: Internet.Latest issue consulted: Apr. 1983.Description based on: June 1979; title fr...

Evaluation of nondestructive inspection techniques for quality control of alumina-ceramic housing components /

Kurkchubasche, R. R.
Stachiw, Jerry D., 1931-
Johnson, R. P. (Richard P.)
Naval Command, Control, and Ocean Surveillance Center (U.S.). Research, Development, Test, and Evaluation Division.

"September 1993."Includes bibliographical references (p. 16).Mode of access: Internet

National Semiconductor Metrology Program : [catalog] /

National Institute of Standards and Technology (U.S.)
National Semiconductor Metrology Program (U.S.)
Electronics and Electrical Engineering Laboratory (National Institute of Standards and Technology)
National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs.

January 1995

Title from cover.Each issue cumulates from 1990 (i.e., v. for Mar. 1995 covers period 1990-1994).Mod...

Optical character recognition (OCR)--Dot matrix character sets for OCR-MA.

United States. National Bureau of Standards.

Cover title.Shipping list no.: 87-559-P."1987 May 6.""Category: Hardware standard, subcategory: char...

Guideline for quality control of image scanners.

Abstract

Extracted data

Guideline for quality control of image scanners.

Abstract

Extracted data

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