Estimating and Testing Process Precision with Presence of Gauge Measurement Errors
- W. Pearn
- Mou-Yuan Liao
DOIAbstract
confidence interval, critical value, gauge measurement error, process capability analysis,
confidence interval, critical value, gauge measurement error, process capability analysis,
Abstract: Problem statement: A measurement control system ensures that measuring equipment and meas...
Abstract Process capability indices Cp, and Cpk have been popularly used in the manufacturing indust...
Capability assessment of the measurement device is one of the methods of process quality control. On...
Due to their effectiveness and simplicity of use, the process capability indices Cp, Cpk, and Cpm ha...
In the manufacturing industry, many product characteristics are of one-sided tolerances. The process...
Gauge measurement error is often an important source of variability in manufacturing applications. ...
Most research works related to process capability indices assume no gauge measurement errors. Howeve...
Various different definitions of multivariate process capability indices have been proposed in the l...
To produce a robust statistical quality control result, it is important to have a good measurement s...
This study is an overview of the capability evaluation of measurement systems. Principally, the dete...
Abstract In a continuous chemical process, the accuracy and reliability of process and analytical me...
This study is an overview of the capability evaluation of measurement systems. Principally...
Alternative definitions of Multivariate Process Capability Indices (MPCIs), based on different appro...
The process capability indices Cp, Cpk are widely used in the modern quality management as statistic...
International audienceThis paper investigates the effects of measurement system variability arising ...
Abstract: Problem statement: A measurement control system ensures that measuring equipment and meas...
Abstract Process capability indices Cp, and Cpk have been popularly used in the manufacturing indust...
Capability assessment of the measurement device is one of the methods of process quality control. On...
Due to their effectiveness and simplicity of use, the process capability indices Cp, Cpk, and Cpm ha...
In the manufacturing industry, many product characteristics are of one-sided tolerances. The process...
Gauge measurement error is often an important source of variability in manufacturing applications. ...
Most research works related to process capability indices assume no gauge measurement errors. Howeve...
Various different definitions of multivariate process capability indices have been proposed in the l...
To produce a robust statistical quality control result, it is important to have a good measurement s...
This study is an overview of the capability evaluation of measurement systems. Principally, the dete...
Abstract In a continuous chemical process, the accuracy and reliability of process and analytical me...
This study is an overview of the capability evaluation of measurement systems. Principally...
Alternative definitions of Multivariate Process Capability Indices (MPCIs), based on different appro...
The process capability indices Cp, Cpk are widely used in the modern quality management as statistic...
International audienceThis paper investigates the effects of measurement system variability arising ...
Abstract: Problem statement: A measurement control system ensures that measuring equipment and meas...
Abstract Process capability indices Cp, and Cpk have been popularly used in the manufacturing indust...
Capability assessment of the measurement device is one of the methods of process quality control. On...
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