Multiple upsets would be available in SRAM-based FPGAs which utilizes SRAM in different parts to implement circuit configuration and to implement circuit data. Moreover, configuration bits of SRAM-based FPGAs are more sensible to upsets compared to circuit data due to significant number of SRAM bits. In this paper, a new protected Configurable Logic Block (CLB) and FPGA architecture are proposed which utilize multiple error correction (DEC) and multiple error detection. This is achieved by the incorporation of recently proposed coding technique Matrix codes [1] inside the FPGA. The power and area analysis of the proposed techniques show that these methods are more efficient than the traditional schemes such as duplication with comparison an...
The configuration memory of SRAM-based Field-Programmable Gate Arrays (FPGAs) is susceptible to radi...
Electronic systems for safety critical applications such as space and avionics need the maximum leve...
International audienceReliability and other uncertainty issues are serious problems for Field Progra...
Multiple upsets would be available in SRAM-based FPGAs which utilizes SRAM in different parts to imp...
Séminaire des jeudis de la com' de l'équipe SCNUsually, there are two ways that a combinational logi...
Field Programmable Gate Arrays (FPGA) are used in a variety of applications, ranging from consumer e...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
International audienceIn this paper we propose a novel SRAM-based FPGA architecture suited for mappi...
Field-programmable gate arrays (FPGAs) are increasingly susceptible to radiation-induced single even...
The very high integration levels reached by VLSI technologies for SRAM-based Field Programmable Gate...
Emerging technology is enabling the design community to consistently expand the amount of functional...
Abstract—SRAM-based FPGAs are susceptible to Single-Event Upsets (SEUs) in radiation-exposed environ...
Summarization: SRAM-based FPGAs are susceptible to SingleEvent Upsets (SEUs) in radiation-exposed en...
This thesis is devoted to the development of Single Event Upset hardness methodologies dedicated to ...
The configuration memory of SRAM-based Field-Programmable Gate Arrays (FPGAs) is susceptible to radi...
Electronic systems for safety critical applications such as space and avionics need the maximum leve...
International audienceReliability and other uncertainty issues are serious problems for Field Progra...
Multiple upsets would be available in SRAM-based FPGAs which utilizes SRAM in different parts to imp...
Séminaire des jeudis de la com' de l'équipe SCNUsually, there are two ways that a combinational logi...
Field Programmable Gate Arrays (FPGA) are used in a variety of applications, ranging from consumer e...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
Static Random-Access Memory-based (SRAM-based) Field-Programmable Gate Arrays (FPGAs) are widely use...
International audienceIn this paper we propose a novel SRAM-based FPGA architecture suited for mappi...
Field-programmable gate arrays (FPGAs) are increasingly susceptible to radiation-induced single even...
The very high integration levels reached by VLSI technologies for SRAM-based Field Programmable Gate...
Emerging technology is enabling the design community to consistently expand the amount of functional...
Abstract—SRAM-based FPGAs are susceptible to Single-Event Upsets (SEUs) in radiation-exposed environ...
Summarization: SRAM-based FPGAs are susceptible to SingleEvent Upsets (SEUs) in radiation-exposed en...
This thesis is devoted to the development of Single Event Upset hardness methodologies dedicated to ...
The configuration memory of SRAM-based Field-Programmable Gate Arrays (FPGAs) is susceptible to radi...
Electronic systems for safety critical applications such as space and avionics need the maximum leve...
International audienceReliability and other uncertainty issues are serious problems for Field Progra...