Parity-unfavored Transitions in Resonant Photoemission From Ar, Kr, and Xe: Experimental and Theoretical Results
- Cooper, J. W.
- Lindle, Dennis W.
- Carlson, T. A.
- Mullins, D. R.
- Beall, C. E.
- Yates, B. W.
- Taylor, J. W.
- Grimm, F. A.
Publication date
January 1990
DOI Publisher
Digital Scholarship@UNLV ISSN
0368-2048Abstract
High-resolution angle-resolved electron spectroscopy with synchrotron radiation has been used to study the angular distributions of resonant-Auger processes near the core-level thresholds Ar2p, Kr3d and Xe4d. Angular-distribution parameters (β) were measured for all resolved peak in the electron spectra and large negative values of β were found for some peaks. A quantitative method for calculating the angular-distribution parameters is described and results of calculations for the Ar2p3/2→4s resonant-Auger spectrum are compared with the experimental results
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