The Transmission Line Matrix (TLM) method has been demonstrated to be capable of simulating the electromagnetic propagation in passive components of monolithic microwave integrated circuits (MMICs), such as microstrip lines, air-bridges, and spiral inductors. The full simulation of MMICs by TLM is hindered by the lack of a GaAs MESFET model. Although SPICE-type lumped element models can be embedded, they are not sufficiently accurate to describe the time dependent response, and they defeat the method since TLM distinguishes itself by being capable of simulating physical structures. In addition, the TLM method cannot simulate a physics-based MESFET model since it cannot model fixed charges in the depletion region, nor can it model the highly...
The linkage between a physical device simulator for small- and large-signal characterization and CAD...
The purpose of this thesis is to investigate the operation of GaAs field-effect transistors with par...
We present a physics-based model for GaAs metal semiconductor field-effect transistors (MESFETs). Th...
As the switching speed of digital integrated circuits (ICs) increases, detrimental effects such as s...
As the switching speed of digital integrated circuits (ICs) increases, detrimental effects such as s...
The linkage between a physical device simulator for small- and large-signal characterization and CAD...
When a signal is applied to the gate electrode in a MESFET, the depletion layer under the gate is no...
The explanation of GaAs metal-semiconductor field effect transistor (MESFET) operation often involve...
The explanation of GaAs metal-semiconductor field effect transistor (MESFET) operation often involve...
The explanation of GaAs metal-semiconductor field effect transistor (MESFET) operation often involve...
The explanation of GaAs metal-semiconductor field effect transistor (MESFET) operation often involve...
The linkage between a physical device simulator for small- and large-signal characterization and CAD...
The linkage between a physical device simulator for small- and large-signal characterization and CAD...
The development of a new semiconductor device is a process which often involves an iterative cycle o...
The purpose of this thesis is to investigate the operation of GaAs field-effect transistors with par...
The linkage between a physical device simulator for small- and large-signal characterization and CAD...
The purpose of this thesis is to investigate the operation of GaAs field-effect transistors with par...
We present a physics-based model for GaAs metal semiconductor field-effect transistors (MESFETs). Th...
As the switching speed of digital integrated circuits (ICs) increases, detrimental effects such as s...
As the switching speed of digital integrated circuits (ICs) increases, detrimental effects such as s...
The linkage between a physical device simulator for small- and large-signal characterization and CAD...
When a signal is applied to the gate electrode in a MESFET, the depletion layer under the gate is no...
The explanation of GaAs metal-semiconductor field effect transistor (MESFET) operation often involve...
The explanation of GaAs metal-semiconductor field effect transistor (MESFET) operation often involve...
The explanation of GaAs metal-semiconductor field effect transistor (MESFET) operation often involve...
The explanation of GaAs metal-semiconductor field effect transistor (MESFET) operation often involve...
The linkage between a physical device simulator for small- and large-signal characterization and CAD...
The linkage between a physical device simulator for small- and large-signal characterization and CAD...
The development of a new semiconductor device is a process which often involves an iterative cycle o...
The purpose of this thesis is to investigate the operation of GaAs field-effect transistors with par...
The linkage between a physical device simulator for small- and large-signal characterization and CAD...
The purpose of this thesis is to investigate the operation of GaAs field-effect transistors with par...
We present a physics-based model for GaAs metal semiconductor field-effect transistors (MESFETs). Th...