[[abstract]]The technique of Electron Beam Induced Currents (EBIC) has been developed in the studies of photovoltaic devices. Through this application, the importance of `topotaxiality' has been demonstrated in the fabrication of efficient solar cells, whether a cell is a heterojunction or a Schottky barrier. The existence of a `dead' region on the surface of any photovoltaic device can also be verified[[fileno]]2030170010042[[department]]電機工程學
Light Beam Induced Current (LBIC) measurement is a non-destructive technique used to perform localiz...
The use of an electostatically blanked electron beam has allowed the application of phase sensitive ...
Electron-beam-induced current (EBIC) measurements have been employed for the investigation of the lo...
The present tutorial review provides a practical guide to the analysis of semiconductor devices usin...
The present tutorial review provides a practical guide to the analysis of semiconductor devices usin...
A number of useful electron-beam-induced current (EBIC) techniques have evolved through the study of...
We describe a new approach for preparing organic-inorganic perovskite solar cells for electron beam-...
We present advanced semiconductor diagnosis by using electron-beam-induced current (EBIC) technique....
The laser cell scanner was used to characterize a number of solar cells made in various materials. A...
In this work electron-beam-induced current (EBIC) is used to study the collection efficiency of emit...
This work aims to clarify the application of electron beam-induced current (EBIC) method for the mor...
As a general qualitative tool, the electron beam induced current (EBIC) method can be very useful in...
Electron-Beam-Induced Current (EBIC) is a technique that makes use of the induced current generated ...
Electron beam induced current EBIC measurements have been employed for the investigation of the l...
Thin film polycrystalline photovoltaics, typically made with CIGS and CdTe absorber layers, are prom...
Light Beam Induced Current (LBIC) measurement is a non-destructive technique used to perform localiz...
The use of an electostatically blanked electron beam has allowed the application of phase sensitive ...
Electron-beam-induced current (EBIC) measurements have been employed for the investigation of the lo...
The present tutorial review provides a practical guide to the analysis of semiconductor devices usin...
The present tutorial review provides a practical guide to the analysis of semiconductor devices usin...
A number of useful electron-beam-induced current (EBIC) techniques have evolved through the study of...
We describe a new approach for preparing organic-inorganic perovskite solar cells for electron beam-...
We present advanced semiconductor diagnosis by using electron-beam-induced current (EBIC) technique....
The laser cell scanner was used to characterize a number of solar cells made in various materials. A...
In this work electron-beam-induced current (EBIC) is used to study the collection efficiency of emit...
This work aims to clarify the application of electron beam-induced current (EBIC) method for the mor...
As a general qualitative tool, the electron beam induced current (EBIC) method can be very useful in...
Electron-Beam-Induced Current (EBIC) is a technique that makes use of the induced current generated ...
Electron beam induced current EBIC measurements have been employed for the investigation of the l...
Thin film polycrystalline photovoltaics, typically made with CIGS and CdTe absorber layers, are prom...
Light Beam Induced Current (LBIC) measurement is a non-destructive technique used to perform localiz...
The use of an electostatically blanked electron beam has allowed the application of phase sensitive ...
Electron-beam-induced current (EBIC) measurements have been employed for the investigation of the lo...