Add to ORKG[[abstract]]In this paper, we present an X-Fill (QC-Fill) method for not only slashing the test time but also reducing the test power (including both capture power and shifting power). QC-Fill, built upon the existing multicasting scan architecture, can coexist with most low-capture-power (LCP) X-fill methods through a multicasting-driven X-Fill method incorporating a clique-stripping scheme. QC-Fill is independent of the ATPG patterns and does not require any area-overhead since it can directly operate on an existing scan architecture incorporating test compression.[[fileno]]2030172030044[[department]]電機工程學
[[abstract]]ATPG-based technique for reducing shift and capture power during scan testing is present...
High power dissipation can occur when the response to a test vector is captured by flip-flops in sca...
In scan-based tests, power consumptions in both shift and capture phases may be significantly higher...
[[abstract]]This paper presents an X-fill scheme that properly utilizes the don't-care bits in test ...
Abstract- Power consumption in scan-based testing is a major concern nowadays. In this paper, we pre...
[[abstract]]A scheme that ATPG-based technique for reducing shift and capture power during scan test...
ISLPED : 2011 International Symposium on Low Power Electronics and Design , 1-3 Aug 2011 , Fukuoka, ...
Research on low-power scan testing has been focused on the shift mode, with little consideration giv...
X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced ...
Excessive power dissipation can cause high voltage droop on the power grid, leading to timing failur...
Research on low-power scan testing has been focused on the shift mode, with little or no considerati...
International audienceHigh-quality at-speed scan testing, characterized by high small-delay-defect d...
[[abstract]]This article presents a universal-multicasting scan architecture for test compression. B...
Yield loss caused by excessive power supply noise has become a serious problem in at-speed scan test...
The occurrence of high switching activity when the response to a test vector is captured by flipflop...
[[abstract]]ATPG-based technique for reducing shift and capture power during scan testing is present...
High power dissipation can occur when the response to a test vector is captured by flip-flops in sca...
In scan-based tests, power consumptions in both shift and capture phases may be significantly higher...
[[abstract]]This paper presents an X-fill scheme that properly utilizes the don't-care bits in test ...
Abstract- Power consumption in scan-based testing is a major concern nowadays. In this paper, we pre...
[[abstract]]A scheme that ATPG-based technique for reducing shift and capture power during scan test...
ISLPED : 2011 International Symposium on Low Power Electronics and Design , 1-3 Aug 2011 , Fukuoka, ...
Research on low-power scan testing has been focused on the shift mode, with little consideration giv...
X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced ...
Excessive power dissipation can cause high voltage droop on the power grid, leading to timing failur...
Research on low-power scan testing has been focused on the shift mode, with little or no considerati...
International audienceHigh-quality at-speed scan testing, characterized by high small-delay-defect d...
[[abstract]]This article presents a universal-multicasting scan architecture for test compression. B...
Yield loss caused by excessive power supply noise has become a serious problem in at-speed scan test...
The occurrence of high switching activity when the response to a test vector is captured by flipflop...
[[abstract]]ATPG-based technique for reducing shift and capture power during scan testing is present...
High power dissipation can occur when the response to a test vector is captured by flip-flops in sca...
In scan-based tests, power consumptions in both shift and capture phases may be significantly higher...