[[abstract]]Delay variation can cause a design to fail its timing specification. Ernst et al. [2003] observe that the worst delay of a design is least probable to occur. They propose a mechanism to detect and correct occasional errors while the design can be optimized for the common cases. Their experimental results show significant performance (or power) gain as compared with the worst-case design. However, the architecture in Ernst et al. [2003] suffers the short path problem, which is difficult to resolve. In this article, we propose a novel error-detecting architecture to solve the short path problem. Our experimental results show considerable performance gain can be achieved with reasonable area overhead.[[fileno]]2030219010045[[depart...
This thesis is focused on the use of timing speculation to improve the performance and energy effici...
In this paper, we propose a timing-reasoning algorithm to improve the resolution of delay fault diag...
[[abstract]]A novel fault model for detecting delay defects of FPGAs is proposed in this paper. Our ...
[[abstract]]©2008 IEEE-Delay variation can cause a design to fail its timing specification. Ernst in...
[[abstract]]Delay variation factors are often statistic in nature. Here, we review and compare three...
Microelectronic scaling has entered into the nanoscale era with tremendous capacity and performance ...
Timing Speculation (TS) is a widely known method for realizing better-than-worst-case systems. Aggre...
The operating clock frequency is determined by the longest signal propagation delay, setup/hold time...
Modern day IC design has drawn a lot of attention towards the path delay fault model (PDF) [1], whic...
Abstract: This paper presents the first known timing-error detection (TED) microprocessor able to op...
Software-based path delay fault testing (SPDFT) has been used to identify faulty chips that cannot m...
Digital circuits have been traditionally designed to meet the worst PVT conditions to guarantee high...
The proposed error detection and correction circuit designed due to the existing circuits accommoda...
some design disciplines have been adopted. For example, the level-sensitive scan design discip-line ...
111 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.A preliminary study of the re...
This thesis is focused on the use of timing speculation to improve the performance and energy effici...
In this paper, we propose a timing-reasoning algorithm to improve the resolution of delay fault diag...
[[abstract]]A novel fault model for detecting delay defects of FPGAs is proposed in this paper. Our ...
[[abstract]]©2008 IEEE-Delay variation can cause a design to fail its timing specification. Ernst in...
[[abstract]]Delay variation factors are often statistic in nature. Here, we review and compare three...
Microelectronic scaling has entered into the nanoscale era with tremendous capacity and performance ...
Timing Speculation (TS) is a widely known method for realizing better-than-worst-case systems. Aggre...
The operating clock frequency is determined by the longest signal propagation delay, setup/hold time...
Modern day IC design has drawn a lot of attention towards the path delay fault model (PDF) [1], whic...
Abstract: This paper presents the first known timing-error detection (TED) microprocessor able to op...
Software-based path delay fault testing (SPDFT) has been used to identify faulty chips that cannot m...
Digital circuits have been traditionally designed to meet the worst PVT conditions to guarantee high...
The proposed error detection and correction circuit designed due to the existing circuits accommoda...
some design disciplines have been adopted. For example, the level-sensitive scan design discip-line ...
111 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.A preliminary study of the re...
This thesis is focused on the use of timing speculation to improve the performance and energy effici...
In this paper, we propose a timing-reasoning algorithm to improve the resolution of delay fault diag...
[[abstract]]A novel fault model for detecting delay defects of FPGAs is proposed in this paper. Our ...