Epitaxial growth, structure and magnetism of epitaxial Ni80Fe20 single crystal, bicrystal, and qua-crystal films

[[abstract]]The thickness, interface roughness, electronic structure, and magnetic moment of thin magnetic epitaxial films, such as Co/Pt, CrPt3, NiFe/NiMn, NiFe/Cr and NiFe/Ru, are measured by X-ray diffraction, X-ray absorption spectroscopy and polarized neutron reflectivity. The magnetic perpendicular anisotropy of epitaxial CrPt3 thin films were studied as functions of composition and growth temperatures. The best perpendicular anisotropy of CrPt3 sample are those with directional ordered L12 structures with order parameters. The study of polarized neutron to reveal the magnetic coupling between magnetic layers and found a quadratic coupling in the NiFe/Cr and NiFe/Ru trilayer.[[fileno]]2060135010093[[department]]工程與系統科學