Interface structure of epitaxial Nb films on sapphire: grazing incidence X-ray diffraction and X-ray reflectivity studies

[[abstract]]The interface structure of MBE grown Nb films on sapphire substrates was studied using grazing incidence X-ray diffraction and X-ray reflectivity measurements. Specifically, the use of these X-ray techniques in probing the buried interfaces was demonstrated. Diffraction effects were observed which are consistent with the presence of misfit dislocations in the interface[[fileno]]2060135030007[[department]]工程與系統科學