[[abstract]]©2006 Elsevier - Sn-0.7 wt.%Cu alloy is a promising Pb-free solder, and Ni is a commonly used barrier layer material. Sn-0.7 wt.%Cu/Ni couples are prepared and reacted at 250 °C. The interfacial reactions are examined, reaction mechanisms are proposed, and solder size effects upon the interfacial reactions are investigated. The Cu6Sn5 phase forms and grows with longer reaction time in the initial stage. Then the Cu6Sn5 phase layer fractures and part of the layer detaches. Microstructural analysis indicates that the detached and the attached layers have finer and larger grains, respectively, and the Cu6Sn5 phase has a near hexagonal prism shape. The freshly exposed Cu6Sn5 phase layer continues to grow and then the reaction la...
0.07Ni-0.01Ge, and Sn-3.5Ag-0.07Ni (in wt.%), were selected to explore the effect of microelements (...
Solid-state interfacial reactions between Sn–3.5Ag solder and electroless Ni–P metallization on Cu s...
Solid-state interfacial reactions between Sn–3.5Ag solder and electroless Ni–P metallization on Cu s...
[[abstract]]c2003 Springer - Specimens with the Sn/Cu/Sn/Ni/Sn/Cu/Sn structure reacted at 200°C are ...
[[abstract]]c2007 Springer - The Delco process is a major flip chip under-bump metallurgy process an...
[[abstract]]c2003 Springer - The Ni/Sn/Ni and Ni/Sn-0.7wt.%Cu/Ni couples are reacted at 200°C for va...
The interfacial reactions of Sn?3.0Ag?0.5Cu (SAC 305) solder on Cu?xZn (x = 0 wt%, 10 wt%, 15 wt%, 3...
Interfacial reaction during wetting and spreading of Sn-Ag-Cu solder on Ni substrate is a key factor...
Sn-9Zn solder is a promising Pb-free solder, but it tends to form bulky intermetallic compounds (IMC...
[[abstract]]Ni-based under-bump metallization (UBM) for flip-chip application is widely used in toda...
[[abstract]]©2006 MRS - Sn-Zn-based alloys are promising low melting-point Pb-free solders, and it h...
[[abstract]]c2006 Springer - Ni-7wt.%V(8at.%V) is an important under bump metallization material, an...
In this paper we will demonstrate how a thermodynamic-kinetic method can be utilized to rationalize ...
[[abstract]]Nickel-based under-bump metallization (UBM) has been widely used in flip-chip technology...
[[abstract]]The eutectic Sn-Ag solder alloy is one of the candidates for the Pb-free solder, and Sn-...
0.07Ni-0.01Ge, and Sn-3.5Ag-0.07Ni (in wt.%), were selected to explore the effect of microelements (...
Solid-state interfacial reactions between Sn–3.5Ag solder and electroless Ni–P metallization on Cu s...
Solid-state interfacial reactions between Sn–3.5Ag solder and electroless Ni–P metallization on Cu s...
[[abstract]]c2003 Springer - Specimens with the Sn/Cu/Sn/Ni/Sn/Cu/Sn structure reacted at 200°C are ...
[[abstract]]c2007 Springer - The Delco process is a major flip chip under-bump metallurgy process an...
[[abstract]]c2003 Springer - The Ni/Sn/Ni and Ni/Sn-0.7wt.%Cu/Ni couples are reacted at 200°C for va...
The interfacial reactions of Sn?3.0Ag?0.5Cu (SAC 305) solder on Cu?xZn (x = 0 wt%, 10 wt%, 15 wt%, 3...
Interfacial reaction during wetting and spreading of Sn-Ag-Cu solder on Ni substrate is a key factor...
Sn-9Zn solder is a promising Pb-free solder, but it tends to form bulky intermetallic compounds (IMC...
[[abstract]]Ni-based under-bump metallization (UBM) for flip-chip application is widely used in toda...
[[abstract]]©2006 MRS - Sn-Zn-based alloys are promising low melting-point Pb-free solders, and it h...
[[abstract]]c2006 Springer - Ni-7wt.%V(8at.%V) is an important under bump metallization material, an...
In this paper we will demonstrate how a thermodynamic-kinetic method can be utilized to rationalize ...
[[abstract]]Nickel-based under-bump metallization (UBM) has been widely used in flip-chip technology...
[[abstract]]The eutectic Sn-Ag solder alloy is one of the candidates for the Pb-free solder, and Sn-...
0.07Ni-0.01Ge, and Sn-3.5Ag-0.07Ni (in wt.%), were selected to explore the effect of microelements (...
Solid-state interfacial reactions between Sn–3.5Ag solder and electroless Ni–P metallization on Cu s...
Solid-state interfacial reactions between Sn–3.5Ag solder and electroless Ni–P metallization on Cu s...