[[abstract]]In an era of submicron technology, routing is becoming a dominant factor in area, timing and power consumption. The problem of scan flip-flops chaining with the objective of achieving minimum routing area overhead is studied. The first attempt is to chain the flip-flops at the logic level. To make more accurate decisions on chaining flip-flops, the second attempt is to perform the chaining of scan flip-flops taking layout information into consideration. Specifically, the authors show that the chaining problem is a travelling salesman problem (TSP). Then, two heuristics, greedy and matching-based algorithms, are proposed to solve the TSP problem. Various cost functions are defined which take layout information into account. Bench...
International audienceScan-based architectures, though widely used in modern designs, are expensive ...
Partial Scan techniques have been widely accepted as an effective solution to improve sequential ATP...
[[abstract]]A fast algorithm is produced for the optimal transistor chaining problem in CMOS functio...
[[abstract]]©1996 THEIET-In an era of submicron technology, routing is becoming a dominant factor in...
[[abstract]]In an era of sub-micron technology, routing is becoming a dominant factor in area, timin...
[[abstract]]In this paper, we present an efficient method for reducing the total length of the scan ...
Scan chain insertion can have a large impact on routability, wirelength, and timing of the design. W...
[[abstract]]We present new methods for scan chain ordering under the minimum wirelength objective. W...
Abstract — This brief addresses the problem of scan-chain ordering under a limited number of through...
Path delay fault testing has become increasingly important due to higher clock rates and higher proc...
[[abstract]]A fast algorithm is proposed for the transistor-chaining problem in CMOS functional cell...
[[abstract]]A fast algorithm is proposed for the optimal transistor-chaining problem in CMOS functio...
AbstractWe study a routing problem which occurs in high-speed (ATM) networks, termed the “rooted vir...
Partial Scan techniques have been widely accepted as an effective solution to improve sequential ATP...
Path delay fault testing becomes increasingly important due to higher clock rates and higher process...
International audienceScan-based architectures, though widely used in modern designs, are expensive ...
Partial Scan techniques have been widely accepted as an effective solution to improve sequential ATP...
[[abstract]]A fast algorithm is produced for the optimal transistor chaining problem in CMOS functio...
[[abstract]]©1996 THEIET-In an era of submicron technology, routing is becoming a dominant factor in...
[[abstract]]In an era of sub-micron technology, routing is becoming a dominant factor in area, timin...
[[abstract]]In this paper, we present an efficient method for reducing the total length of the scan ...
Scan chain insertion can have a large impact on routability, wirelength, and timing of the design. W...
[[abstract]]We present new methods for scan chain ordering under the minimum wirelength objective. W...
Abstract — This brief addresses the problem of scan-chain ordering under a limited number of through...
Path delay fault testing has become increasingly important due to higher clock rates and higher proc...
[[abstract]]A fast algorithm is proposed for the transistor-chaining problem in CMOS functional cell...
[[abstract]]A fast algorithm is proposed for the optimal transistor-chaining problem in CMOS functio...
AbstractWe study a routing problem which occurs in high-speed (ATM) networks, termed the “rooted vir...
Partial Scan techniques have been widely accepted as an effective solution to improve sequential ATP...
Path delay fault testing becomes increasingly important due to higher clock rates and higher process...
International audienceScan-based architectures, though widely used in modern designs, are expensive ...
Partial Scan techniques have been widely accepted as an effective solution to improve sequential ATP...
[[abstract]]A fast algorithm is produced for the optimal transistor chaining problem in CMOS functio...