[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational or sequential circuit. We use a fault simulation-based technique to approximate each internal signal's correcting power. The correcting power of a particular signal is measured in terms of the signal's correctable set, namely, the maximum set of erroneous input vectors or sequences that can be corrected by resynthesizing the signal. Only the signals that can correct every given erroneous input vector or sequence are considered as a potential error source. Our algorithm offers three major advantages over existing methods. First, unlike symbolic approaches, it is applicable for large circuits. Second, it delivers more accurate results than oth...
In this paper, we propose a simulation-before-test (SBT) fault diagnosis methodology based on the us...
Error metrics are used to evaluate the quality of an approximated circuit or to trade-off several ap...
119 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.Our experimental results show...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...
This paper addresses the problem of locating design errors in a sequential circuit. For single-error...
[[abstract]]This paper presents a parallel vector simulation-based approach to locating multiple err...
ISBN: 3540603859We present a new diagnostic algorithm for localising design errors in sequential cir...
ISBN: 0792377311We describe a new method for design error diagnosis in digital circuits that does no...
This paper describes a diagnosis technique for locating design errors in circuit implementations whi...
In this paper, we present multiple error diagnosis algorithms to overcome two significant problems a...
With the increase in the complexity of VLSI circuit design, logic design errors can occur during syn...
A dynamic diagnosis scheme for synchronous sequential circuits is proposed. In contrast with schemes...
Fault diagnosis is performed to locate and identify physical failures in a defective integrated circ...
Abstract: In this paper, we propose a simulation-before-test (SBT) fault diagnosis methodology base...
In this paper, we propose a simulation-before-test (SBT) fault diagnosis methodology based on the us...
Error metrics are used to evaluate the quality of an approximated circuit or to trade-off several ap...
119 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.Our experimental results show...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...
This paper addresses the problem of locating design errors in a sequential circuit. For single-error...
[[abstract]]This paper presents a parallel vector simulation-based approach to locating multiple err...
ISBN: 3540603859We present a new diagnostic algorithm for localising design errors in sequential cir...
ISBN: 0792377311We describe a new method for design error diagnosis in digital circuits that does no...
This paper describes a diagnosis technique for locating design errors in circuit implementations whi...
In this paper, we present multiple error diagnosis algorithms to overcome two significant problems a...
With the increase in the complexity of VLSI circuit design, logic design errors can occur during syn...
A dynamic diagnosis scheme for synchronous sequential circuits is proposed. In contrast with schemes...
Fault diagnosis is performed to locate and identify physical failures in a defective integrated circ...
Abstract: In this paper, we propose a simulation-before-test (SBT) fault diagnosis methodology base...
In this paper, we propose a simulation-before-test (SBT) fault diagnosis methodology based on the us...
Error metrics are used to evaluate the quality of an approximated circuit or to trade-off several ap...
119 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.Our experimental results show...