Author name used in this publication: C. H. Woo2005-2006 > Academic research: refereed > Publication in refereed journalVersion of RecordPublishe
X-ray analysis of ferroelectric thin layers of Ba1/2Sr1/2TiO3 with different thicknesses reveals the...
Author name used in this publication: C. K. WongAuthor name used in this publication: F. G. ShinVers...
A discrete dislocation plasticity analysis of plastic deformation in metal thin films caused by ther...
Author name used in this publication: C. H. Woo2005-2006 > Academic research: refereed > Publication...
2011-2012 > Academic research: refereed > Publication in refereed journalVersion of RecordPublishe
Author name used in this publication: C. H. Woo2004-2005 > Academic research: refereed > Publication...
Author name used in this publication: C. H. Woo2005-2006 > Academic research: refereed > Publication...
2003-2004 > Academic research: refereed > Publication in refereed journalVersion of RecordPublishe
Author name used in this publication: C. H. Woo2006-2007 > Academic research: refereed > Publication...
Author name used in this publication: C. H. Woo2011-2012 > Academic research: refereed > Publication...
thermal stress in single crystal thin films on a rigid substrate are used to study size effects. The...
The properties and the performance of epitaxial semiconductor thin films depend on the stress-state ...
Stress development and relaxation in polycrystalline thin films perfectly bonded to a stiff substrat...
It is shown that very large stresses may be present in the thin films that comprise integrated circu...
[[abstract]]The system of an epitaxial film on a semi-infinite substrate of a different material is ...
X-ray analysis of ferroelectric thin layers of Ba1/2Sr1/2TiO3 with different thicknesses reveals the...
Author name used in this publication: C. K. WongAuthor name used in this publication: F. G. ShinVers...
A discrete dislocation plasticity analysis of plastic deformation in metal thin films caused by ther...
Author name used in this publication: C. H. Woo2005-2006 > Academic research: refereed > Publication...
2011-2012 > Academic research: refereed > Publication in refereed journalVersion of RecordPublishe
Author name used in this publication: C. H. Woo2004-2005 > Academic research: refereed > Publication...
Author name used in this publication: C. H. Woo2005-2006 > Academic research: refereed > Publication...
2003-2004 > Academic research: refereed > Publication in refereed journalVersion of RecordPublishe
Author name used in this publication: C. H. Woo2006-2007 > Academic research: refereed > Publication...
Author name used in this publication: C. H. Woo2011-2012 > Academic research: refereed > Publication...
thermal stress in single crystal thin films on a rigid substrate are used to study size effects. The...
The properties and the performance of epitaxial semiconductor thin films depend on the stress-state ...
Stress development and relaxation in polycrystalline thin films perfectly bonded to a stiff substrat...
It is shown that very large stresses may be present in the thin films that comprise integrated circu...
[[abstract]]The system of an epitaxial film on a semi-infinite substrate of a different material is ...
X-ray analysis of ferroelectric thin layers of Ba1/2Sr1/2TiO3 with different thicknesses reveals the...
Author name used in this publication: C. K. WongAuthor name used in this publication: F. G. ShinVers...
A discrete dislocation plasticity analysis of plastic deformation in metal thin films caused by ther...
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