Author name used in this publication: C. H. XuAuthor name used in this publication: C. H. WooAuthor name used in this publication: S. Q. ShiAuthor name used in this publication: Y. Wang2003-2004 > Academic research: refereed > Publication in refereed journalVersion of RecordPublishe
F.Z. and B.J.R. gratefully acknowledge support from the China Scholarship Council and Science Founda...
Piezoresponse force microscopy (PFM) is a powerful method widely used for nanoscale studies of the e...
peer-reviewedThe ability to reliably measure electromechanical properties is crucial to the advancem...
The objective of this work was to understand the effect of the movable electrode (the tip of an atom...
Cataloged from PDF version of article.Using an atomic force microscope(AFM) with a silicon cantileve...
Atomic Force Microscopy (AFM) is a type of Scanning Probe Microscopy (SPM) which involves a probe ti...
Nanotechnology is the branch of science which deals with the manipulation of matters at an extremely...
Piezoresponse force microscopy (PFM) probes the mechanical deformation of a sample in response to an...
Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale Piezorespo...
Cataloged from PDF version of article.We present a mechanical model for the atomic force microscope ...
This thesis focuses on ferroelectric thin film characterization through Piezoresponse Force Microsco...
Thesis (Ph.D.)--University of Washington, 2018In the last decades, nanotechnology has built great ex...
In this paper, we review recent advances in piezoresponse force microscopy (PFM) with respect to nan...
There has been tremendous interest in piezoelectricity at the nanoscale, for example in nanowires an...
The present study employed an Atomic Force Microscope (AFM) for the characterization of ferroelectri...
F.Z. and B.J.R. gratefully acknowledge support from the China Scholarship Council and Science Founda...
Piezoresponse force microscopy (PFM) is a powerful method widely used for nanoscale studies of the e...
peer-reviewedThe ability to reliably measure electromechanical properties is crucial to the advancem...
The objective of this work was to understand the effect of the movable electrode (the tip of an atom...
Cataloged from PDF version of article.Using an atomic force microscope(AFM) with a silicon cantileve...
Atomic Force Microscopy (AFM) is a type of Scanning Probe Microscopy (SPM) which involves a probe ti...
Nanotechnology is the branch of science which deals with the manipulation of matters at an extremely...
Piezoresponse force microscopy (PFM) probes the mechanical deformation of a sample in response to an...
Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale Piezorespo...
Cataloged from PDF version of article.We present a mechanical model for the atomic force microscope ...
This thesis focuses on ferroelectric thin film characterization through Piezoresponse Force Microsco...
Thesis (Ph.D.)--University of Washington, 2018In the last decades, nanotechnology has built great ex...
In this paper, we review recent advances in piezoresponse force microscopy (PFM) with respect to nan...
There has been tremendous interest in piezoelectricity at the nanoscale, for example in nanowires an...
The present study employed an Atomic Force Microscope (AFM) for the characterization of ferroelectri...
F.Z. and B.J.R. gratefully acknowledge support from the China Scholarship Council and Science Founda...
Piezoresponse force microscopy (PFM) is a powerful method widely used for nanoscale studies of the e...
peer-reviewedThe ability to reliably measure electromechanical properties is crucial to the advancem...