Due to the character of the original source materials and the nature of batch digitization, quality control issues may be present in this document. Please report any quality issues you encounter to digital@library.tamu.edu, referencing the URI of the item.Includes bibliographical references: p. 51-53.Issued also on microfiche from Lange Micrographics.This thesis investigates the effect of transient faults on a processor and proposes on-chip fault tolerant design techniques to improve its reliability. The target processor is a general 32-bit, four stage pipeline, dual context RISC style design used at network interface. Fault injection simulation using single bitflip in the gate-level description of the processor is used to determine softwar...
Fault tolerance is a key requirement in several application domains of embedded processors cores. In...
This thesis deals with the design and validation of low-cost error detecting mechanisms that can be ...
Continuous technology scaling in semiconductor industry forces reliability as a serious design conce...
The evolution of high-performance and low-cost microprocessors has led to their almost pervasive usa...
The adoption of Microprocessors is increasingly diversifying to several embedded and mo- bile device...
This paper presents a detailed analysis of the behavior of a novel fault-tolerant 32-bit embedded CP...
Using formal verification for designing hardware designs free from logic design bugs has been an act...
As processor manufacturers keep pushing the limits of the transistor, the reliability of computer sy...
[[abstract]]Businesses and individuals often suffer from significant amount of damage as a result of...
the progression of shrinking technologies into processes below 100nm has increased the importance of...
With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field...
One effective fault injection approach involves instrumenting the RTL in a controlled manner to inco...
Smaller feature size, greater chip density, and minimal power consumption all lead to an increased n...
Achieving reduced time-to-market in modern electronic designs targeting safety critical applications...
Technology scaling has proceeded into dimensions in which the reliability of manufactured devices i...
Fault tolerance is a key requirement in several application domains of embedded processors cores. In...
This thesis deals with the design and validation of low-cost error detecting mechanisms that can be ...
Continuous technology scaling in semiconductor industry forces reliability as a serious design conce...
The evolution of high-performance and low-cost microprocessors has led to their almost pervasive usa...
The adoption of Microprocessors is increasingly diversifying to several embedded and mo- bile device...
This paper presents a detailed analysis of the behavior of a novel fault-tolerant 32-bit embedded CP...
Using formal verification for designing hardware designs free from logic design bugs has been an act...
As processor manufacturers keep pushing the limits of the transistor, the reliability of computer sy...
[[abstract]]Businesses and individuals often suffer from significant amount of damage as a result of...
the progression of shrinking technologies into processes below 100nm has increased the importance of...
With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field...
One effective fault injection approach involves instrumenting the RTL in a controlled manner to inco...
Smaller feature size, greater chip density, and minimal power consumption all lead to an increased n...
Achieving reduced time-to-market in modern electronic designs targeting safety critical applications...
Technology scaling has proceeded into dimensions in which the reliability of manufactured devices i...
Fault tolerance is a key requirement in several application domains of embedded processors cores. In...
This thesis deals with the design and validation of low-cost error detecting mechanisms that can be ...
Continuous technology scaling in semiconductor industry forces reliability as a serious design conce...