X-ray photoelectron diffraction study of ultrathin PbTiO3 films
- Despont, L.
- Lichtensteiger, Céline
- Clerc, F.
- Garnier, M. G.
- Garcia de Abajo, F.J.
- Van Hove, M. A.
- Triscone, Jean-Marc
- Aebi, P.
Publication date
January 2006
DOI Publisher
Springer Science and Business Media LLC ISSN
1434-6028 Citation count (estimate)
10Abstract
Full hemispherical X-ray photoelectron diffraction (XPD) experiments have been performed to investigate at the atomic level ultrathin epitaxial c-axis oriented PbTiO3 (PTO) films grown on Nb-doped SrTiO3 substrates. Comparison between experiment and theory allows us to identify a preferential ferroelectric polarization state in a 60 angstrom - thick PTO film. Multiple scattering theory based on a cluster-model [Phys. Rev. B 63, 075404 ( 2001)] is used to simulate the experiments
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