Due to the impact of process variations, timing characteristics of chip is uncertain due to uncertainty in delay of many gates. Gate delays are modeled as Probability Density Functions at discrete time points. Therefore Validated Monte Carlo based analysis is conducted on Circuit Netlist to Calculate Probability Density Function at Circuit output with varying Probability Density Function at internal gates. This Monte Carlo analysis is extended to Zero Suppressed Binary Decision Diagrams for the purpose of calculating Probability Density Function accurately at circuit output. In Monte Carlo analysis on Zero Suppressed Binary Decision Diagrams each and every circuit path is stored implicitly. Future work will apply the presented statistical t...
Variability in process parameters is making accurate timing anal-ysis of nano-scale integrated circu...
Abstract—To increase the accuracy of static timing analysis, the traditional nonlinear delay models ...
This thesis targets the problem of critical path identification in sub-micron devices. Delays are de...
In this paper, we highlight a fast, effective and practical statistical approach that deals with int...
In today's semiconductor technology, the size of a transistor is made smaller and smaller. One of th...
Accurate timing analysis of digital integrated circuits is becoming harder to achieve with current a...
Abstract—To improve the accuracy of static timing analysis, the traditional nonlinear delay models a...
Variations of process parameters have an important impact on reliability and yield in deep sub micro...
DoctorAggressive technology scaling in feature size has propelled designers to integrate millions of...
In chip design, one of the main objectives is to decrease its clock cycle; however, the existing app...
Our aim is the development of a novel probabilistic method to estimate the power consumption of a co...
The reliability of Very Large Scale Integration (VLSI) circuits has become increasingly susceptible ...
Abstract — The intrinsic atomistic variability of nano-scale integrated circuit (IC) technology must...
Abstract—Variations of process parameters have an important impact on reliability and yield in deep ...
We propose a false-path-aware statistical timing analysis frame-work. In our framework, cell as well...
Variability in process parameters is making accurate timing anal-ysis of nano-scale integrated circu...
Abstract—To increase the accuracy of static timing analysis, the traditional nonlinear delay models ...
This thesis targets the problem of critical path identification in sub-micron devices. Delays are de...
In this paper, we highlight a fast, effective and practical statistical approach that deals with int...
In today's semiconductor technology, the size of a transistor is made smaller and smaller. One of th...
Accurate timing analysis of digital integrated circuits is becoming harder to achieve with current a...
Abstract—To improve the accuracy of static timing analysis, the traditional nonlinear delay models a...
Variations of process parameters have an important impact on reliability and yield in deep sub micro...
DoctorAggressive technology scaling in feature size has propelled designers to integrate millions of...
In chip design, one of the main objectives is to decrease its clock cycle; however, the existing app...
Our aim is the development of a novel probabilistic method to estimate the power consumption of a co...
The reliability of Very Large Scale Integration (VLSI) circuits has become increasingly susceptible ...
Abstract — The intrinsic atomistic variability of nano-scale integrated circuit (IC) technology must...
Abstract—Variations of process parameters have an important impact on reliability and yield in deep ...
We propose a false-path-aware statistical timing analysis frame-work. In our framework, cell as well...
Variability in process parameters is making accurate timing anal-ysis of nano-scale integrated circu...
Abstract—To increase the accuracy of static timing analysis, the traditional nonlinear delay models ...
This thesis targets the problem of critical path identification in sub-micron devices. Delays are de...