Sampling Criterion for EMC Near Field Measurements

An alternative, quasi-empirical sampling criterion for EMC near field measurements intended for close coupling investigations is proposed. The criterion is based on maximum error caused by sub-optimal sampling of near fields in the vicinity of an elementary dipole, which is suggested as a worst-case representative of a signal trace on a typical printed circuit board. It has been found that the sampling density derived in this way is in fact very similar to that given by the antenna near field sampling theorem, if an error less than 1 dB is required. The principal advantage of the proposed formulation is its parametrization with respect to the desiredmaximum error in measurements. This allows the engineer performing the near field scan to choose a suitable compromise between accuracy and measurement time