To meet an insatiable consumer demand for greater performance at less power, silicon technology has scaled to unprecedented dimensions. However, the pursuit of faster processors and longer battery life has come at the cost of reliability. Given the rise of processor reliability as a first-order design constraint, there has been a growing interest in low-cost, non-intrusive techniques for transient fault detection. Many of these recent proposals have counted on the availability of hardware recovery mechanisms. Although common in aggressive out-of-order cores, hardware support for speculative rollback and recovery is less common in lower-end commodity processors. This paper presents Encore, a software-based fault recovery mechanism tailored f...
Intermittent hardware faults are hard to diagnose as they occur non-deterministically. Hardware-only...
We present a method to recover from failures caused by soft-ware bugs. Our method relies on two key ...
Abstract—Transient faults are emerging as a critical concern in the reliability of general-purpose m...
To meet an insatiable consumer demand for greater performance at less power, silicon technology has ...
Aggressive scaling of CMOS transistors has enabled extensive system integration and building faster ...
As transistor technology scales ever further, hardware reliability is becoming harder to manage. Th...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
To meet an insatiable consumer demand for greater performance at less power, silicon technology has ...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
As microprocessors continue to evolve and grow in function-ality, the use of smaller nanometer techn...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
Abstract—As silicon technology continues to scale down and validation expenses continue to increase,...
As chip densities and clock rates increase, processors are becoming more susceptible to transient fa...
To improve performance and reduce power, processor designers employ advances that shrink feature siz...
Since current multi-core processors are more com- plex systems on a chip than previous generations, ...
Intermittent hardware faults are hard to diagnose as they occur non-deterministically. Hardware-only...
We present a method to recover from failures caused by soft-ware bugs. Our method relies on two key ...
Abstract—Transient faults are emerging as a critical concern in the reliability of general-purpose m...
To meet an insatiable consumer demand for greater performance at less power, silicon technology has ...
Aggressive scaling of CMOS transistors has enabled extensive system integration and building faster ...
As transistor technology scales ever further, hardware reliability is becoming harder to manage. Th...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
To meet an insatiable consumer demand for greater performance at less power, silicon technology has ...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
As microprocessors continue to evolve and grow in function-ality, the use of smaller nanometer techn...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
Abstract—As silicon technology continues to scale down and validation expenses continue to increase,...
As chip densities and clock rates increase, processors are becoming more susceptible to transient fa...
To improve performance and reduce power, processor designers employ advances that shrink feature siz...
Since current multi-core processors are more com- plex systems on a chip than previous generations, ...
Intermittent hardware faults are hard to diagnose as they occur non-deterministically. Hardware-only...
We present a method to recover from failures caused by soft-ware bugs. Our method relies on two key ...
Abstract—Transient faults are emerging as a critical concern in the reliability of general-purpose m...