Dependence of storage capacity <i>p</i> on potential width <i>C</i> and network size <i>N</i>, for representative examples of the decay rate <i>r</i>₁.

(A) Dependence of p on C for . In the small r1 limit, the optimal potential width C* is zero (i.e., a single well potential), and p decreases weakly with C. The number of stored patterns increases logarithmically with network size, as demonstrated in (C). (B) Dependence of p on C for . The number of stored patterns p reaches its maximum at a nonzero value of C. The optimal storage capacity increases as a power law of N, as demonstrated in (D). (C) Storage capacity of the single-well potential model (C = 0) as a function of with network size N. The storage capacity decreases when r1 increases as indicated by Eq (10). (D) Storage capacity of the double well potential model (C = C*, full lines) as a function of network size N. When , the optimal storage capacity is much larger than the storage capacity of the single well potential model (dashed lines with the same color). The dashed-dotted black line represents for reference. Other parameters in this figure are r2 = 1, r3 = 0, θ = 0, f = 0.5, c = 0.05.