Communication plays a crucial role in the design of high performance Multiprocessor Systems-on-Chip (MPSoC). Accordingly, Networks-on-Chip (NoC) have been successfully employed as a solution to deal with communication in complex MPSoCs. NoC-based architectures are characterized by various tradeoffs related to structural characteristics, performance specifications, and application demands. In new technologies, the relative values of wire delays and power consumption are increasing as the number of cores in 2D chips increase. The recent 3D IC technology applied to NoC architectures allows greater device integration and shorter interconnection links, which directly influences the communication performance. Through-Silicon Vias (TSVs) are used ...
Abstract—In recent 3DIC studies, through silicon vias (TSV) are usually employed as the vertical int...
With the use of multi-core architectures, the Network-on-Chip (NoC) became an important research top...
International audienceSeveral Through-Silicon-Vias (TSVs) may present resistive and open defects due...
ISBN :8-1-4419-7617-8The shrinking of processing technology in the deep submicron domain aggravates ...
Design Constraints imposed by global interconnect de-lays as well as limitations in integration of d...
The physical performance of a 3-Dimensional Network-on-Chip (NoC) mesh architecture employing throug...
Three-dimensional integrated circuits (3D ICs) offer a promising solution to overcome the on-chip co...
Three-dimensional integrated circuits are a promising approach to push beyond the integration issues...
3D integration is an emerging technology that overcomes 2D integration process limitations. The use ...
Design constraints imposed by global interconnect delays as well as limitations in integration of di...
Abstract—The physical performance of a 3-Dimensional Network-on-Chip (NoC) mesh architecture employi...
none3Three-dimensional (3D) manufacturing technologies are viewed as promising solutions to the ban...
The use of short Through-Silicon Vias (TSVs) in 3D integration Technology introduces a significant r...
Through silicon vias (TSVs) provide an efficient way to support vertical communication among differe...
Networks-on-chip (NoC) is emerging as a key on-chip communication architecture for multiprocessor sy...
Abstract—In recent 3DIC studies, through silicon vias (TSV) are usually employed as the vertical int...
With the use of multi-core architectures, the Network-on-Chip (NoC) became an important research top...
International audienceSeveral Through-Silicon-Vias (TSVs) may present resistive and open defects due...
ISBN :8-1-4419-7617-8The shrinking of processing technology in the deep submicron domain aggravates ...
Design Constraints imposed by global interconnect de-lays as well as limitations in integration of d...
The physical performance of a 3-Dimensional Network-on-Chip (NoC) mesh architecture employing throug...
Three-dimensional integrated circuits (3D ICs) offer a promising solution to overcome the on-chip co...
Three-dimensional integrated circuits are a promising approach to push beyond the integration issues...
3D integration is an emerging technology that overcomes 2D integration process limitations. The use ...
Design constraints imposed by global interconnect delays as well as limitations in integration of di...
Abstract—The physical performance of a 3-Dimensional Network-on-Chip (NoC) mesh architecture employi...
none3Three-dimensional (3D) manufacturing technologies are viewed as promising solutions to the ban...
The use of short Through-Silicon Vias (TSVs) in 3D integration Technology introduces a significant r...
Through silicon vias (TSVs) provide an efficient way to support vertical communication among differe...
Networks-on-chip (NoC) is emerging as a key on-chip communication architecture for multiprocessor sy...
Abstract—In recent 3DIC studies, through silicon vias (TSV) are usually employed as the vertical int...
With the use of multi-core architectures, the Network-on-Chip (NoC) became an important research top...
International audienceSeveral Through-Silicon-Vias (TSVs) may present resistive and open defects due...