A prototype industrial defect inspection system, which can operate at speeds of up to 1 ms-1 and over web widths of 500 mm, is being developed at the National Physical Laboratory for roll-to-roll manufacturing of highly-transparent materials. The prototype is designed to detect defects with lateral dimensions larger than 10 μm. The findings of a feasibility study for a sensor based on dark-field imaging principles are presented. The design of the sensor is introduced and the results of a preliminary characterisation are discussed. Off-the-shelf equipment was used including a monochromatic CMOS sensor paired with a telecentric lens. The illumination was supplied from a high-power LED and a range of illumination wavelengths was used. The char...
Traditional defect inspection for highly-parallel manufacturing processes requires the processing of...
Multi-beam scanning systems are being used in automated industrial manufacturing environments to det...
We have developed an actinic full-field inspection system to detect multilayer phase defect with dar...
A prototype industrial defect inspection system, which can operate at speeds of up to 1 ms-1 and ove...
A prototype industrial defect inspection system, which can operate at speeds of up to 1 ms-1 and ove...
This paper presents an all-optical difference engine (AODE) sensor for detecting the defects in prin...
This paper presents an all-optical difference engine (AODE) sensor for detecting the defects in prin...
This paper presents an all-optical difference engine (AODE) sensor for detecting the defects in prin...
In many industrial applications, the inspection of the produced product is an important step to guar...
Modern surfaces are often used as technical design elements. The high-quality appearance of these su...
This paper presents an automated defect detection system for coated plastic components for the autom...
This paper presents an automated defect detection system for coated plastic components for the autom...
The increasing capabilities of roll-to-roll (R2R) printing processes present challenges for quality ...
The increasing capabilities of roll-to-roll (R2R) printing processes present challenges for quality ...
OVERVIEW: The scaling down of cutting-edge semiconductor devices is just getting faster and faster. ...
Traditional defect inspection for highly-parallel manufacturing processes requires the processing of...
Multi-beam scanning systems are being used in automated industrial manufacturing environments to det...
We have developed an actinic full-field inspection system to detect multilayer phase defect with dar...
A prototype industrial defect inspection system, which can operate at speeds of up to 1 ms-1 and ove...
A prototype industrial defect inspection system, which can operate at speeds of up to 1 ms-1 and ove...
This paper presents an all-optical difference engine (AODE) sensor for detecting the defects in prin...
This paper presents an all-optical difference engine (AODE) sensor for detecting the defects in prin...
This paper presents an all-optical difference engine (AODE) sensor for detecting the defects in prin...
In many industrial applications, the inspection of the produced product is an important step to guar...
Modern surfaces are often used as technical design elements. The high-quality appearance of these su...
This paper presents an automated defect detection system for coated plastic components for the autom...
This paper presents an automated defect detection system for coated plastic components for the autom...
The increasing capabilities of roll-to-roll (R2R) printing processes present challenges for quality ...
The increasing capabilities of roll-to-roll (R2R) printing processes present challenges for quality ...
OVERVIEW: The scaling down of cutting-edge semiconductor devices is just getting faster and faster. ...
Traditional defect inspection for highly-parallel manufacturing processes requires the processing of...
Multi-beam scanning systems are being used in automated industrial manufacturing environments to det...
We have developed an actinic full-field inspection system to detect multilayer phase defect with dar...