Understanding the condensed matter physics of the uranium oxides remains an active area of research despite its long history. Within this thesis, the fundamental properties of these complex oxide systems are systematically explored through the use of stoichiometrically varied thin films of UO2+x. Through epitaxially matching the UO2 crystal structure to a suitable substrate material, these samples are synthesised by reactive DC magnetron sputtering in a partial oxygen atmosphere at high temperatures. This produces macroscopic single crystal surfaces, with the thickness of the thin films varied from nanometre to micrometre length scales.Post-growth, these thin films are treated through cycles of high temperature annealing, either under vacuu...
We measured the transmittance and reflectance of two samples in the extreme ultraviolet (XUV) at the...
We measured the transmittance and reflectance of two samples in the extreme ultraviolet (XUV) at the...
Thin films of U1− xThxO2 (x = 0 to 1) have been deposited via reactive DC sputter technique and char...
XPS determination of the oxygen coefficient k O =2+x and ionic (U 4+ , U 5+ and U 6+ ) composit...
XPS determination of the oxygen coefficient kO = 2 + x and ionic (U4+, U5+, and U6+) composition of ...
A (111) air-exposed surface of UO2 thin film (150 nm) on (111) YSZ (yttria-stabilized zirconia) befo...
XPS determination of the oxygen coefficient kO = 2 + x and ionic (U(4+), U(5+), and U(6+)) compositi...
AbstractThin films of U1−xThxO2 (x=0 to 1) have been deposited via reactive DC sputter technique and...
We describe a method to produce U2O5 film in-situ using the Labstation, a modular machine developed ...
XPS determination of the oxygen coefficient k O =2+x and ionic (U 4+ , U 5+ and U 6+ ) \ud compos...
AbstractThin films of U1−xThxO2 (x=0 to 1) have been deposited via reactive DC sputter technique and...
This work presents the results of a detailed structural characterisation of irradiated and unirradia...
Uranium dioxide (UO2), thorium dioxide (ThO2), and UxTh1-xO2 alloys are characterized for suitabilit...
Thin films of U1− xThxO2 (x = 0 to 1) have been deposited via reactive DC sputter technique and char...
We measured the transmittance and reflectance of two samples in the extreme ultraviolet (XUV) at the...
We measured the transmittance and reflectance of two samples in the extreme ultraviolet (XUV) at the...
We measured the transmittance and reflectance of two samples in the extreme ultraviolet (XUV) at the...
Thin films of U1− xThxO2 (x = 0 to 1) have been deposited via reactive DC sputter technique and char...
XPS determination of the oxygen coefficient k O =2+x and ionic (U 4+ , U 5+ and U 6+ ) composit...
XPS determination of the oxygen coefficient kO = 2 + x and ionic (U4+, U5+, and U6+) composition of ...
A (111) air-exposed surface of UO2 thin film (150 nm) on (111) YSZ (yttria-stabilized zirconia) befo...
XPS determination of the oxygen coefficient kO = 2 + x and ionic (U(4+), U(5+), and U(6+)) compositi...
AbstractThin films of U1−xThxO2 (x=0 to 1) have been deposited via reactive DC sputter technique and...
We describe a method to produce U2O5 film in-situ using the Labstation, a modular machine developed ...
XPS determination of the oxygen coefficient k O =2+x and ionic (U 4+ , U 5+ and U 6+ ) \ud compos...
AbstractThin films of U1−xThxO2 (x=0 to 1) have been deposited via reactive DC sputter technique and...
This work presents the results of a detailed structural characterisation of irradiated and unirradia...
Uranium dioxide (UO2), thorium dioxide (ThO2), and UxTh1-xO2 alloys are characterized for suitabilit...
Thin films of U1− xThxO2 (x = 0 to 1) have been deposited via reactive DC sputter technique and char...
We measured the transmittance and reflectance of two samples in the extreme ultraviolet (XUV) at the...
We measured the transmittance and reflectance of two samples in the extreme ultraviolet (XUV) at the...
We measured the transmittance and reflectance of two samples in the extreme ultraviolet (XUV) at the...
Thin films of U1− xThxO2 (x = 0 to 1) have been deposited via reactive DC sputter technique and char...