We investigate power constrained test access mechanism (TAM) scheduling for core-based system by combining scan-chain partitioning and preemption. We discuss scan-chain partitioning in core-based design to minimize test time while satisfying test power constraint and we outline a wrapper supporting a variable number of scan-chains at a core. We demonstrate that optimal test time can be achieved both for a fixed TAM and under power constraint. We also investigate practical limitations, model the problem as a Knapsack problem and propose an algorithm. Experiments using our implementation shows its efficiency compared to previous approaches.http://library.naist.jp/mylimedio/dllimedio/show.cgi?bookid=100032620&oldid=5864
[[abstract]]© 2004 Springer Verlag - The test scheduling problem is one of the major issues in the t...
[[abstract]]Test access mechanism (TAM) and testing schedule for system-on-chip (SOC) are challengin...
Abstract:- Increasing complexity of System-on-Chip (SOC) has encouraged the engineers to design vers...
In this paper, we show that the test access mechanism (TAM) scheduling is equal to the independent j...
Abstract1 In this paper, we show that the scheduling of tests on the test access mechanism (TAM) is ...
[[abstract]]In this paper, we propose an algorithm based on a framework of reconfigurable multiple s...
Abstract:- This paper presents a framework and an efficient method to determine SOC test schedules. ...
[[abstract]]This paper presents a framework and an efficient method to determine SOC test schedules....
[[abstract]]©2002 IEEE-We propose an efficient test scheduling and test access architecture for syst...
This paper presents a wrapper and test access mechanism design for multi-clock domain SoCs that cons...
[[abstract]]We propose an efficient test scheduling and test access architecture for system-on-chip....
Test access mechanisms (TAMs) are an important component of a system-on-chip (SOC) test architecture...
This paper describes an integrated framework for plug-and-play SOC test automation. This framework i...
This paper presents a new test access mechanism (TAM) architecture and optimization method based on ...
This paper presents a new test access mechanism (TAM) architecture and optimization method based on ...
[[abstract]]© 2004 Springer Verlag - The test scheduling problem is one of the major issues in the t...
[[abstract]]Test access mechanism (TAM) and testing schedule for system-on-chip (SOC) are challengin...
Abstract:- Increasing complexity of System-on-Chip (SOC) has encouraged the engineers to design vers...
In this paper, we show that the test access mechanism (TAM) scheduling is equal to the independent j...
Abstract1 In this paper, we show that the scheduling of tests on the test access mechanism (TAM) is ...
[[abstract]]In this paper, we propose an algorithm based on a framework of reconfigurable multiple s...
Abstract:- This paper presents a framework and an efficient method to determine SOC test schedules. ...
[[abstract]]This paper presents a framework and an efficient method to determine SOC test schedules....
[[abstract]]©2002 IEEE-We propose an efficient test scheduling and test access architecture for syst...
This paper presents a wrapper and test access mechanism design for multi-clock domain SoCs that cons...
[[abstract]]We propose an efficient test scheduling and test access architecture for system-on-chip....
Test access mechanisms (TAMs) are an important component of a system-on-chip (SOC) test architecture...
This paper describes an integrated framework for plug-and-play SOC test automation. This framework i...
This paper presents a new test access mechanism (TAM) architecture and optimization method based on ...
This paper presents a new test access mechanism (TAM) architecture and optimization method based on ...
[[abstract]]© 2004 Springer Verlag - The test scheduling problem is one of the major issues in the t...
[[abstract]]Test access mechanism (TAM) and testing schedule for system-on-chip (SOC) are challengin...
Abstract:- Increasing complexity of System-on-Chip (SOC) has encouraged the engineers to design vers...