Location of quantum dots identified by microscopic photoluminescence changes during nanoprobe indentation with a horizontal scan

[出版社版]The location of quantum dots (QDs) embedded in a GaAs matrix is successfully identified by microscopic photoluminescence (PL) measurement during nanoprobe indentation with a horizontal scan at low temperature (10 K). By introducing a high-sensitive load cell and a focused ion beam-fabricated flat-apex nanoprobe, the indentation force and PL of QDs are measured simultaneously at each point in the direction of the nanoprobe horizontal scanning with a constant indentation force. The experimental results show that the emission energy from QDs has a strong dependence on the location of QDs relative to the nanoprobe-indented location. Consequently, the emission energy shifts with the nanoprobe scan, generating an emission trace with a constant indentation force. Based on the energy shift of the ground state of the QD simulated by the combination of three-dimensional finite element strain calculation and strain-dependent k center dot p Hamiltonian, an estimation method is developed, which enables us to identify the location of the QD from its emission trace in the nanoprobe indentation experiment. Results indicate that all the emission traces clearly observed are emitted from the QDs around the edge of the nanoprobe-indented area. Further discussion reveals that the evolution of shear strain generates hole accumulation around the contact edge of the indented nanoprobe. Consequently, the high density of holes enhances the PL of the QDs in that region