International audienceThe paper proposes a diagnosis approach corresponding to the specific MES level to provide information on the origins of a performance indicator degradation. Our key distribution is the proposal of a set of potential causes that may impact the successful completion of production operations, such as the operator stress, quality of material, equipment or recipe change and their characteristic parameters by exploiting MES historical database. We use Bayesian Network model to diagnose the potential failure causes and support effective human decisions on corrective actions (maintenance, human resource planning, recipe re-qualification, etc) by computing conditional probabilities for each suspected proposed causes
International audienceThis paper presents a general methodology to improve risk assessment in the sp...
Today root causes of failures and quality deviations in manufacturing are usually identified using e...
This paper develops a generic degradation model based on Dynamic Bayesian Networks (DBN) which predi...
International audienceThe paper proposes a diagnosis approach corresponding to the specific MES leve...
Cette thèse s'inscrit dans le domaine de la diagnostic, en particulier de Manufacturing Execution Sy...
Abstract: This paper proposes a method to accurately locate the source of product quality drift in a...
International audiencePresent manufacturing systems are equipped with sensors that provide a basis f...
International audienceThis paper provides a comprehensive data-driven diagnosis approach applicable ...
This paper provides a comprehensive data-driven diagnosis approach applicable to complex manufacturi...
This paper presents an approach to troubleshooting in Manufacturing Execution Systems (MES) to impro...
International audienceThis paper proposes an approach to accurately localize the origin of product q...
This Phd thesis takes place in the diagnostic field, especially in contexte of Manufacturing Execut...
International audienceNowadays, Semiconductor Manufacturing is operating in an intense competitive e...
Semiconductor Industry (SI) is facing the challenge of short product life cycles due to increasing d...
The Semiconductor Industry (SI) is facing the challenge of high-mix low-volume production due to inc...
International audienceThis paper presents a general methodology to improve risk assessment in the sp...
Today root causes of failures and quality deviations in manufacturing are usually identified using e...
This paper develops a generic degradation model based on Dynamic Bayesian Networks (DBN) which predi...
International audienceThe paper proposes a diagnosis approach corresponding to the specific MES leve...
Cette thèse s'inscrit dans le domaine de la diagnostic, en particulier de Manufacturing Execution Sy...
Abstract: This paper proposes a method to accurately locate the source of product quality drift in a...
International audiencePresent manufacturing systems are equipped with sensors that provide a basis f...
International audienceThis paper provides a comprehensive data-driven diagnosis approach applicable ...
This paper provides a comprehensive data-driven diagnosis approach applicable to complex manufacturi...
This paper presents an approach to troubleshooting in Manufacturing Execution Systems (MES) to impro...
International audienceThis paper proposes an approach to accurately localize the origin of product q...
This Phd thesis takes place in the diagnostic field, especially in contexte of Manufacturing Execut...
International audienceNowadays, Semiconductor Manufacturing is operating in an intense competitive e...
Semiconductor Industry (SI) is facing the challenge of short product life cycles due to increasing d...
The Semiconductor Industry (SI) is facing the challenge of high-mix low-volume production due to inc...
International audienceThis paper presents a general methodology to improve risk assessment in the sp...
Today root causes of failures and quality deviations in manufacturing are usually identified using e...
This paper develops a generic degradation model based on Dynamic Bayesian Networks (DBN) which predi...